CCD modulation transfer function measuring device and method

A technique of modulating transfer function and measuring device, applied in the field of optical detection, can solve the problems of affecting test results, staying, and the knife edge cannot be placed, and achieves the effects of improving test accuracy, ensuring accuracy, and improving accuracy

Inactive Publication Date: 2015-01-14
XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0008] The above methods have their own advantages and disadvantages. The first two methods basically stay in the laboratory stage and cannot be applied in engineering.
The third type of algorithm has a corresponding diffraction effect on the edge of the knife because of the different positions of the knife edge, which affects the test results
Although this can avoid the influence of the edge diffra

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  • CCD modulation transfer function measuring device and method

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Embodiment Construction

[0040] see figure 1, a kind of CCD modulation transfer function measuring device provided by the present invention comprises three-dimensional adjustment system, light source 1, light processing unit; The light processing unit is fixed on the three-dimensional adjustment system, and light processing unit comprises target slit 2 and microscope objective lens 8; The tested CCD 11 includes the tested CCD photosensitive surface; the target slit, the microscopic objective lens and the tested CCD photosensitive surface are sequentially arranged on the outgoing light path of the light source; the microscopic objective lens includes two surfaces, one of which is provided with mounting threads, and The surface with mounting threads is the image side, and the other side is the object side. For the microscopic objective lens, the outgoing light of the light source is incident on the image side of the microscopic objective lens, and exits from the object side of the microscopic objective l...

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Abstract

The invention discloses a CCD modulation transfer function measuring device and method. The CCD modulation transfer function measuring device comprises a three-dimensional adjusting system, a light source and an optical processing unit. The optical processing unit is fixed to the three-dimensional adjusting system. The optical processing unit comprises a target slit and a microscope objective. The target slit and the microscope objective are arranged on an emergent light path of the light source in sequence. The microscope objective comprises two faces, wherein threads are arranged on one face, the face with the threads is an image space, and the other face is an object space. Emergent light of the light source conducts incidence from the image space and conducts outgoing from the object space. According to the CCD modulation transfer function measuring device and method, the high-imaging-quality target silt with the width smaller than one micron is provided for obtaining of a line spread function, the obtained shrunk high-quality target silt is converged on a measured imaging device array, so that fine sampling is achieved, and the measurement precision is improved.

Description

technical field [0001] The invention belongs to the field of optical detection, and relates to a CCD modulation transfer function measurement device and a measurement method, which can be established for a color CCD with a high-precision modulation transfer function measurement device. Background technique [0002] At present, the measurement methods of CCD transfer function can be divided into three categories, one is to focus on the structure and electrical characteristics of CCD itself, starting from the physical model of CCD working mechanism, analyzing the physical process of CCD work, and obtaining the theoretical model of CCD transfer function. More typically, Ibrahima Djit et al. of the University of Toulouse in France proposed a theoretical model of the CCD transfer function solved by the steady-state diffusion equation under the condition of sinusoidal light injection. Therefore, it is difficult to realize this method, and it only stays in the laboratory stage at p...

Claims

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Application Information

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IPC IPC(8): G01M11/02
Inventor 薛勋段亚轩陈永权赵建科胡丹丹张洁李坤徐亮刘峰田留德潘亮赛建刚周艳高斌赵怀学张周锋
Owner XI'AN INST OF OPTICS & FINE MECHANICS - CHINESE ACAD OF SCI
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