A method for calibrating a
spectrometer device in a batch of
spectrometer devices is disclosed in the abstract of a method for calibrating a
spectrometer device in a batch of spectrometer devices. The present invention relates to a
spectrograph arrangement comprising at least one
detector arrangement comprising at least one optical element configured to separate incident light into a spectrum having constituent
wavelength components and further comprising a plurality of
light sensitive elements, each photosensitive element is configured for receiving at least a portion of one of the constituent
wavelength components and for generating a respective
detector signal as a function of an illumination of the respective photosensitive element by at least a portion of the respective constituent
wavelength component, the method comprising the following steps: a) at least one
system characterization step, the at least one
system characterization step comprises determining a
line spread function at a corresponding wavelength by comparing at least one spectrum measured by using the spectrometer device with at least one reference spectrum; 15b) at least one resolution homogenization step comprising converting, for each wavelength, the resolution of the
line spread function to a predefined target resolution for the corresponding wavelength, where the target resolution for each wavelength is a predefined target batch resolution value for the corresponding wavelength. 20 (Fig. 1A).