The invention relates to a slit-method measurement method for a
modulation transfer function of a digital X-
ray imaging
system. The slit-method measurement method comprises the following steps: 1) setting
exposure parameters of the digital X-
ray imaging
system and collecting slit images; 2) carrying out slit position detection through
edge detection and obtaining a slit straight line by utilizing
line fitting; 3) carrying out Hough transformation on a slit straight line image to obtain slit inclination
angle alpha, and constructing an
oversampling LSF curve; 4) utilizing an I-spline curve as a regression spline curve f to carry out least square fit on the left and right two parts of the
oversampling LSF curve, and meanwhile, meeting constraint conditions, that is, during fitting, guaranteeing that the left part of the LSF curve is a monotone non-decreasing function, and the right part is a monotone non-increasing function, and obtaining a
line spread function; and 5) carrying out
Fourier transform and then mod operation on the
line spread function to obtain a
modulation transfer function thereof, and finally, obtaining a normalized
modulation transfer function. Compared with the conventional slit measurement method, the method can obtain more accurate MTF curve.