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Liquid sample drying device, dry sample test piece and preparation method thereof

A drying device and sample technology, applied in the field of dry sample test pieces, can solve problems such as the inability to use dry liquid samples, and achieve the effect of solving the aggregation phenomenon

Active Publication Date: 2017-11-03
MATERIAL ANALYSIS TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, such as atomic force microscopy, which requires the probe head to be close to the dry sample (nanoscale distance), it will not be possible to use the device for drying liquid samples as described in the previous case.

Method used

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  • Liquid sample drying device, dry sample test piece and preparation method thereof
  • Liquid sample drying device, dry sample test piece and preparation method thereof
  • Liquid sample drying device, dry sample test piece and preparation method thereof

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Embodiment Construction

[0093] In order to better understand the concept of the present invention, multiple specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. The same symbols represent members or devices having the same or similar functions. Wherein, the shapes, dimensions, proportions, etc. of the components shown in the drawings are only for illustration, and do not limit the implementation scope of the present invention. In addition, although any embodiment described in the following description discloses multiple technical features at the same time, it does not mean that all technical features in any one embodiment must be implemented at the same time. In addition, the manufacturing method of the liquid sample drying device of the present invention can be mass-produced through the existing semiconductor technology and / or MEMS technology. Wherein, the substrate is, for example, the first substrate 21 or the second su...

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Abstract

The invention discloses a liquid sample drying device, a dried sample test piece and its preparation method. The liquid sample drying device contains two substrates, at least a distance piece and a clamping member. Each substrate has a surface. The two surfaces are arranged opposite to each other. The distance piece is arranged between the two substrates such that a sample holding area is formed between the two surfaces so as to hold a liquid sample. The clamping member contacts the two substrates such that the two substrates and at least one distance piece are clamped and fixed temporarily.

Description

technical field [0001] The invention relates to a liquid sample drying device, in particular to a liquid sample drying device that can be used for microscope observation, a method for preparing a dry sample test piece using the liquid sample drying device, and a dry sample test piece prepared by the method. Dry the sample coupons. Background technique [0002] With the advancement of microscope technology, various microscopes have been developed, such as optical microscope (Optical Microscope), atomic force microscope (Atomic Force Microscope, AFM), electron microscope such as transmission electron microscope (Transmission Electron Microscope, TEM), scanning electron microscope Microscope (Scanning Electron Microscope, SEM), etc. [0003] Generally speaking, in order to cooperate with microscope observation, various sample test piece devices for carrying samples are produced correspondingly, such as liquid sample test pieces and dry sample test pieces. [0004] Please refe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/28
Inventor 戴麟霭陈玉菁孙致融张平
Owner MATERIAL ANALYSIS TECH INC
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