Multi-atmosphere high-temperature dielectric temperature spectrum testing method

Abstract

The invention discloses a multi-atmosphere high-temperature dielectric temperature spectrum testing method. The multi-atmosphere high-temperature dielectric temperature spectrum testing method is used for solving the technical problem that according to an existing temperature spectrum testing method, the error is large. According to the technical scheme, the multi-atmosphere high-temperature dielectric temperature spectrum testing method comprises the steps that a sample to be tested is placed in an atmosphere environment in which the temperature can be controlled; peripheral equipment is controlled by means of a computer, a dielectric testing parameter is preset, and compensatory calibration is completed once through a dielectric performance test instrument, so that a system error is reduced; the temperature change of the sample to be tested is monitored by a temperature feedback device according to a command of the computer; after measurement is completed at all testing frequencies, an interrupt signal is sent by the dielectric performance test instrument, and test results are read by the computer in a batch mode; after all data are verified, data passing verification are stored, and a measurement process is completed; the temperature change of a system is monitored by the computer continuously, and the measurement process is executed repeatedly till testing is completed. Due to the fact that data are tested in a batch mode under the condition of multiple frequency points, testing data are fed back in a batch mode, the average value of the measurement values obtained by conducting measurement multiple times is obtained, the validity of data is verified, wrong values are eliminated, and measurement precision is improved.

Description

technical field

[0001] The invention relates to a high-temperature dielectric thermospectrum testing method, in particular to a multi-atmosphere high-temperature dielectric thermospectral testing method. Background technique

[0002] Electronic materials play an important role in today's high-tech fields. The continuous development of the level of science and technology has put forward higher requirements for the performance and parameter accuracy of electronic materials. Correspondingly, higher requirements have been put forward for the testing methods and testing systems of electronic materials.

[0003] The document "Development of Atmospheric Environment Dielectric Temperature Spectrum Testing System, Journal of Xi'an University of Science and Technology, 2011, Vol.31(7), p460-467" discloses a method for testing thermograms under atmospheric conditions. This method uses the computer as the control platform, and reads the temperature through the temperature control devic...

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