Beam monitor system and particle beam irradiation system

A technology of monitoring system and irradiation system, which is applied in the field of beam monitoring system of particle beam irradiation system, and can solve the problems of high cost, large-scale monitoring system, complex structure, etc.

Active Publication Date: 2015-02-11
HITACHI LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In spot position monitors, signal amplifiers and signal processing devices are required along with the number of channels, and signal amplification and signal processing are performed on all channels in beam

Method used

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  • Beam monitor system and particle beam irradiation system
  • Beam monitor system and particle beam irradiation system
  • Beam monitor system and particle beam irradiation system

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Experimental program
Comparison scheme
Effect test

no. 1 approach

[0034] use Figure 1 to Figure 14 The first embodiment of the beam monitoring system and the particle beam irradiation system of the present invention will be described.

[0035]In the present invention, the particle beam irradiation system refers to a system for irradiating charged particle beams 12 (for example, proton beams, carbon rays, etc.) to affected parts of patients fixed on a treatment table (bed device) 10 in a treatment room.

[0036] First, use Figure 1 ~ Figure 4 The configuration of the particle beam irradiation system of the present invention will be described.

[0037] figure 1 is a configuration diagram showing the overall configuration of the first embodiment of the particle beam irradiation system of the present invention, figure 2 It is a configuration diagram showing the outline of a scanning irradiation system and an irradiation control system constituting the first embodiment of the particle beam irradiation system of the present invention, imag...

no. 2 approach

[0158] use Figure 15 and Figure 16 A second embodiment of the beam monitoring system and particle beam irradiation system of the present invention will be described.

[0159] Figure 15 It is a figure which shows an example of the distribution of the fitting function and the measured value of the 2nd embodiment of the beam monitoring system of this invention, Figure 16 It is a diagram showing another example of the distribution of the fitting function and the actual measurement value of the second embodiment of the beam monitoring system of the present invention.

[0160] In the beam monitoring system of the second embodiment, in the upstream beam monitor monitoring and control device 8b1 or the downstream beam monitor monitoring and control device 8b2, as conditions for judging appropriate irradiation, in addition to beam position and beam width The condition that the calculation result is less than the allowable value is also applied when the average value (variance va...

no. 3 approach

[0180] use Figure 17 A third embodiment of the beam monitoring system and particle beam irradiation system of the present invention will be described.

[0181] Figure 17 It is a flowchart of the control of charged particle beam irradiation by raster scanning method.

[0182] The first embodiment is a particle beam irradiation system including a beam monitoring system for monitoring the beam position and beam width in the spot scanning irradiation method. Beam monitoring system that monitors beam position and beam width.

[0183] The particle beam irradiation system according to the present embodiment includes the following beam monitoring system for monitoring the beam position and beam width in the raster scanning irradiation method, which divides the affected part of the patient 13 into a plurality of layers in the beam advancing direction, and Irradiation of the charged particle beam is maintained continuously in each layer (beam is kept on), and the charged particle b...

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Abstract

A charge collection electrode is formed of a plurality of groups each of which is made up of a plurality of adjoining wire electrodes. Further, all the wire electrodes are connected to channels of a signal processing device 22 by the same number of lines as the wire electrodes belonging to one group so that each detection signal outputted from one wire electrode selected from each group is inputted through the same line and so that no two adjoining channels are physically continuous in regard to a certain set of consecutive measurement channels. The signal processing device 22 determines group information indicating to which group the wire electrodes that sent the inputted detection signals belong and outputs a processing signal including the group information to a beam monitor controller 8b2. The beam monitor controller 8b2 determines the position and the beam width of the charged particle beam 12 that passed through the wire electrodes.

Description

technical field [0001] The present invention relates to a beam monitoring system for monitoring the beam position in a charged particle beam (particle beam) irradiation system, and particularly relates to a particle beam suitable for irradiating an affected part with a particle beam such as protons or carbon ions for treatment A beam monitoring system for a particle beam irradiation system of a therapeutic device. Background technique [0002] There are known therapeutic methods of irradiating charged particle beams (particle beams, ion beams) such as protons and carbon ions to affected parts of patients with cancer or the like. A particle beam irradiation system used for this treatment includes a charged particle beam generator. The ion beam accelerated by the charged particle beam generating device passes through the first beam conveying system and the second beam conveying system arranged on the rotating platform to reach the irradiation device arranged on the rotating p...

Claims

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Application Information

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IPC IPC(8): A61N5/10
CPCA61N2005/1074A61N5/1065G01T1/2935A61N5/1077
Inventor 堀能士森山国夫岩本朋久田所昌宏
Owner HITACHI LTD
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