Collisional broadening compensation using real or near-real time validation in spectroscopic analyzers

Abstract

Validation verification data quantifying an intensity of light reaching a detector of a spectrometer from a light source of the spectrometer after the light passes through a validation gas across a known path length can be collected or received. The validation gas can include an amount of an analyte compound and an undisturbed background composition that is representative of a sample gas background composition of a sample gas to be analyzed using a spectrometer. The sample gas background composition can include one or more background components. The validation verification data can be compared with stored calibration data for the spectrometer to calculate a concentration adjustment factor, and sample measurement data collected with the spectrometer can be modified using this adjustment factor to compensate for collisional broadening of a spectral peak of the analyte compound by the background components. Related methods, articles of manufacture, systems, and the like are described.

Description

[0001] Cross References to Related Applications [0002] This application claims priority to U.S. Patent Application No. 13 / 428,591, filed March 23, 2012, to co-pending and commonly owned U.S. Patent Application No. 13 / 026,921 and co-pending and commonly owned US Patent Application No. 13 / 027,000 is related to and is related to commonly owned US Patent Application No. 7,508,521, commonly owned US Patent No. 7,704,301, and commonly owned US Patent No. 7,819,946. The disclosures of each of the related applications and patents are incorporated herein by reference in their entirety. technical field [0003] The subject matter described herein relates to compensation for the effects of collisional broadening made by spectroscopic analyzers on measurements such as the detection and / or quantification of trace gases. Background technique [0004] Spectroscopic analysis generally relies on the detection and quantification of emission or absorption of radiation by substances, such as...

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Problems solved by technology

[0008] Typical industry standard humidity analyzers based on tunable diode laser spectrometers such as the SpectraSensors Model SS2000 (available from SpectraSensors, Inc. of Houston, Texas) or the General Electric Aurora (available from GE Measurement and Control Solutions of Billerica, Mass. scheme) may not be able to provide the necessary measurement accuracy over such a wide range of stream composition variations due to spectral lineshape broadening caused by unknown gas sample components

In another example, the U.S. Department of Energy (DOE) sponsored an evaluation project titled "Development of In Situ Analysis for the Chemical Industry," which was conducted by the Dow Chemical Company and concluded that harmonic spectroscopy Tunable diode lasers are poorly suited for gas analysis applications in the chemical process industry due to their measurement sensitivity to changes in gas composition

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