Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High definition image type measurement instrument

A measuring instrument, high-definition technology, applied in instruments, measuring devices, microscopes, etc., can solve problems such as low edge contrast, and achieve the effect of improving contrast, improving work efficiency, and improving measurement accuracy

Inactive Publication Date: 2015-02-25
SUZHOU EASSON OPTOELECTRONICS
View PDF5 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The invention provides a high-definition image-type measuring instrument, which solves the problem of low edge contrast for pure white, transparent and low-reflection workpieces. A variety of LED lamp beads combined with a variety of angles with the central axis of the light source, greatly improving the contrast of the impact edge, so that the measurement system can get a clearer picture image effect, and enhance the image boundary, thereby improving the measurement accuracy; and easy to operate, greatly improving work efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High definition image type measurement instrument
  • High definition image type measurement instrument
  • High definition image type measurement instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0024] Embodiment: A kind of high-definition image type measuring instrument comprises a base 1, an LED lighting source 12, an image mirror sleeve 9 and a measuring table 2, and the image mirror sleeve 9 includes an encoder 24 and is composed of a second 1. The transmission system composed of the second and third gears 25, 26, and 27 meshing in sequence. A motor 20 and the encoder 24 are fixed on the Z-axis drive mechanism 10, and the first gear 25 is arranged on the output shaft of the motor 20. , the second gear 26 is arranged on the rotating shaft of the encoder 24, and the third gear 27 is arranged on the image mirror sleeve 9; The microscope magnifies, the image mirror sleeve turns right, and the focusing lens 8 times decreases. The rotation of the stepper motor 20 is controlled by the control signal sent by the control system. The rotation of the stepper motor 20 drives the sleeve to rotate through the transmission system, and the sleeve rotates to adjust the magnificati...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high definition image type measurement instrument which comprises a base, an LED upper lamp light source, an image lens sleeve and a measurement worktable. A coder and a transmission system formed by sequentially meshing a first gear, a second gear and a third gear are arranged in the image lens sleeve. The first gear is arranged on an output shaft of a motor, the second gear is arranged on a rotating shaft of the coder, and the third gear is arranged on the image lens sleeve. A plurality of red LED lamp beads, yellow LED lamp beads, blue LED lamp beads and green LED lamp beads are embedded in a plurality of inclined holes formed in a lamp plate, and the inclined holes form acute included angles with the axis of the lamp plate. The red LED lamp beads, the yellow LED lamp beads, the blue LED lamp beads and the green LED lamp beads are arranged from inside to outside to form at least four LED lamp rings. The high definition image type measurement instrument greatly improves the contract influencing the edge and enhances the image boundary so as to improve the measurement precision, is convenient to operate, and greatly improves the working efficiency.

Description

technical field [0001] The invention relates to a precision measuring device, in particular to a high-definition image measuring instrument. Background technique [0002] Image measuring instrument, also known as high-definition image measuring instrument, overcomes the shortcomings of traditional projectors and is a new type of high-precision, high-tech measuring instrument integrating optical, mechanical, electrical, and computer image technologies. The optical microscope performs high-magnification optical magnification imaging on the object to be measured. After the enlarged object image is sent to the computer through the CCD camera system, it can efficiently detect the contour and surface shape, size, angle and position of various complex workpieces, especially precision Microscopic inspection and quality control of parts. The measurement data can be directly input into AUTOCAD to become a complete engineering drawing. The graphics can be generated as DXF documents, a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G02B21/06G02B21/36G01B11/00
CPCG02B21/0004G01B11/00G02B21/06G02B21/368
Inventor 陆庆年吴菌
Owner SUZHOU EASSON OPTOELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com