Phase encoding-based colorful structured light rapid three-dimensional measurement method

Abstract

The invention discloses a phase encoding-based colorful structured light rapid three-dimensional measurement method. The phase encoding-based colorful structured light rapid three-dimensional measurement method is composed of four major key parts, namely, a colorful sinusoidal stripe encoding principle, a colorful phase stripe encoding principle, an inter-channel color crosstalk eliminating principle and a three-dimensional measurement principle. According to a traditional sinusoidal stripe and phase encoding stripe projection method, three frames of sinusoidal stripes and three frames of phase encoding stripes are required to be projected respectively, the phase shift of each frame of sinusoidal stripes ranging from 120 to 0, the phase shift of each frame of phase encoding stripes ranging from 120 to 0, while with the phase encoding-based colorful structured light rapid three-dimensional measurement method of the invention adopted, only one frame of colorful sinusoidal stripes and one frame of colorful phase encoding stripes are required to be projected respectively, and therefore, three-dimensional measurement speed can be greatly improved. The phase encoding-based colorful structured light rapid three-dimensional measurement method has potential application prospect and practical value in fast and real-time three-dimensional measurement of dynamic objects.

Description

technical field [0001] The invention relates to a three-dimensional measurement method, in particular to a fast three-dimensional measurement method based on phase coding of colored structured light. Background technique [0002] Structured light projection profilometry is of great significance in three-dimensional measurement due to the advantages of non-contact, full-field lossless measurement, fast measurement speed, high sensitivity and high degree of automation. 3D measurement systems such as figure 1 As shown, it includes DLP projector 1, color CCD 2, workstation 3, measurement support 4, reference plane 5 and object 6 to be measured; DLP projector 1 and color CCD 2 are placed on measurement support 4; DLP projector 1 and color CCD 2 are respectively The workstation 3 is connected through a data line; the object to be measured 6 is placed on the reference plane 5; the workstation 3 includes an image acquisition card, projection software, and measurement software. The...

AI Technical Summary

Problems solved by technology

The traditional three-dimensional measurement method of sinusoidal fringes plus phase-encoded fringes needs to project three frames of sinusoidal fringes and three frames of phase-encoded fringes under the condition of the least number of phase shift steps, which takes a long time and directly affects the measurement speed. This single-channel Measurement technology has been unable to meet the current development trend of faster and better measurement of the three-dimensional shape of objects

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