Method and system for calibrating long-baseline infrared binocular imaging ceilometer
A binocular imaging, long baseline technology, used in instruments, measuring devices, etc.
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[0026] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0027] figure 1 It is a schematic flow chart of the long baseline infrared binocular imaging ceilometer calibration method provided by the embodiment of the present invention, as shown in figure 1 As shown, the present embodiment provides a long baseline infrared binocular imaging ceilometer calibration method, comprising: step 11, installing the first camera system and the second camera system of the long baseline infrared binocular imaging ceilometer to measure angles respectively device. The existing high-precision attitude meter is expensive, while the high-precision goniometer is much cheaper. This method only needs to use a pair of high-precision goniometers to obtain the relative attitude angle of the two cameras, and can correct it in real time. The measurement accuracy can reach 0.01 degree.
[0028] Step 12, laboratory calibration, first adjust t...
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