Stripe reflection three-dimensional measurement method based on binary stripe defocusing

Abstract

The invention discloses a stripe reflection three-dimensional measurement method based on binary stripe defocusing. Three key parts comprising the binary stripe encoding principle, a defocusing projection system and the stripe reflection three-dimensional measurement principle are involved. The method has the advantages that (1) an LED display is utilized for projecting binary stripes, and the LED emits light in a semiconductor light emitting diode mode due to the fact that only 0 gray level and 255 gray level are provided, so that the projection speed of the LED display is greatly increased, and the three-dimensional measurement speed is greatly increased; (2) due to the fact that the binary stripe defocusing method is adopted, the distance between the LED display and the reference plane can be increased, and the measurement range of the LED display is larger than that of a traditional LCD display; (3) the binary stripe defocusing method is adopted to form sine stripes on the surface of a measured object, so that a CCD is focused on the measured object, and a clear deformation stripe image modulated by the object height is photographed. The measurement precision is improved.

Description

technical field [0001] The invention relates to a mirror-like three-dimensional measurement method, in particular to a fringe reflection three-dimensional measurement method based on binary fringe defocusing. Background technique [0002] The fringe reflection 3D measurement method is of great significance in 3D measurement due to the advantages of non-contact, full field measurement, fast measurement speed and easy information processing when measuring mirror-like objects. 3D measurement experimental devices such as figure 1 As shown, it includes an LED display 1, a CCD camera 2, a computer 3, a workstation 4, a reference plane 5 and an object to be measured 6; the LED display 1 projects the stripes with characteristic information onto the reference plane 5, and the CCD camera 2 collects stripe information , and the reference phase is obtained after processing by the workstation 4 . Then place the object to be measured 6 at the same position, obtain the corresponding defo...

AI Technical Summary

Problems solved by technology

In the previous method, when the CCD is focused on the measured object, the image of the sinusoidal fringe projected by the display is in a defocused state, so the image of the deformed fringe modulated by the height of the object is blurred, which reduces the measurement accuracy.

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