Device for testing metal electrical resistivity change within continuous temperature range

Abstract

The invention discloses a device for testing metal electrical resistivity change within a continuous temperature range. The device comprises a positioning mechanism, a heating system and a measurement system. The heating system comprises a heating furnace and a temperature control box connected with the heating furnace. The measurement system comprises a computer and a signal control box connected with the computer, the computer is connected with the temperature control box through a communication line, a vacuum pipe is arranged in the heating furnace, the positioning mechanism is arranged in the vacuum pipe, sealing valve bodies are arranged at the two ends of the vacuum pipe, the sealing valve body at one end of the vacuum pipe is connected with a vacuum pump, the sealing valve body at the other end of the vacuum pipe is connected with the signal control box, a temperature sensor, a current signal input clamp and a signal collecting clamp are arranged in the vacuum pipe, and the current signal input clamp and the signal collecting clamp are connected with the signal control box through wires. Through the method, the device can realize precise measurement of the metal electrical resistivity change at different heating speeds.

Description

technical field [0001] The invention relates to the fields of material analysis and electronic testing equipment, in particular to a testing device for metal resistivity change within a continuous temperature range. Background technique [0002] The conventional test method for resistivity test is the four-probe or four-wire method, which is generally tested at room temperature and is mainly used in the test of semiconductor resistivity. There are also four-probe or four-wire methods used in the metal resistivity test, but a large current is often required to generate a potential between the probes, and the high current often brings heating effects, which affects the resistivity test. The traditional resistivity test or the single-chip test method cannot store and analyze the data, and the single function cannot meet the test requirements of modern rapid development, or the functions of multiple instruments are required to realize the test and measurement, and the cost is hi...

AI Technical Summary

Problems solved by technology

There are also four-probe or four-wire methods used in the metal resistivity test, but a large current is often required to generate a potential between the probes, and the high current often brings heating effects, which affects the resistivity test.

The traditional resistivity test or the single-chip test method, the data cannot be stored and analyzed, and the single function cannot meet the test requirements of modern rapid development, or the functions of multiple instruments are required to realize the test and measurement, and the cost is high

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