Multimode SRAM single-particle testing method and device

Abstract

The invention provides a multimode SRAM single-particle testing method and a multimode SRAM single-particle testing device. The device comprises a control board and a testing board, wherein the control board comprises a power supply module, a communication module, a buffering module, a main control module, a current monitoring module, a level conversion module and a first interface module; the testing board comprises a second interface module and a testing clamp. The invention further provides the multimode SRAM single-particle testing method. The device provided by the invention can utilize three modes to test multiple SRAM chips; during testing, a power supply of a to-be-tested SRAM and a signal voltage value can be configured in an upper computer as required so as to facilitate the testing. A data comparison operation of a testing system is performed by an FPGA, and a quick error bit counting algorithm is utilized, so that compared error data can be quickly obtained in real time.

Description

technical field [0001] The invention relates to the fields of device reliability, aviation, aerospace, automotive electronics, communication and the like, in particular to a multi-mode SRAM single-particle testing method and device. Background technique [0002] SRAM (Static Random Access Memory) memory has the advantages of fast access speed, so a large number of SRAMs are used in the development of aviation and spacecraft electronic systems to store configuration information, test data, etc. While the spacecraft is flying in space, it has always been in a radiation environment composed of charged particles. High-energy protons and heavy ions in the space radiation environment, and neutrons in the atmospheric environment can cause single event effects in SRAM devices in aviation and spacecraft. , so that the data stored in the SRAM changes randomly, which affects the reliability of the device, so the ability of the SRAM device in the spacecraft to resist the single event ef...

AI Technical Summary

Problems solved by technology

In addition, as the critical size of the device shrinks, the α particles in the SRAM package of the ground equipment will also cause a single event effect, seriously affecting the normal operation of the equipment, especially the control system in the car, the switchboard in the communication and financial fields, etc. Bring hidden dangers to people's property and safety

[0003] The existing single event test system has a relatively single function. When testing the single event effect of SRAM devices, it cannot measure the single event effect parameters of SRAM devices in many ways, thus ignoring the single event effects of some aspects of SRAM devices.

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