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Intelligent test system based on TEDS sensor and matrix switch technology and test method thereof

A matrix switch and test system technology, applied in the direction of instruments, measuring devices, and reducing unwanted effects, can solve the problems of increasing test costs, unsatisfactory results, and large manpower costs, and achieve simple structure, error avoidance, and application broad effect

Active Publication Date: 2015-04-08
PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, replacing a sensor with a larger linear range will increase the cost of testing, requiring a lot of manpower and material resources, and the effect is often unsatisfactory; in terms of data correction, a nonlinear circuit is designed to compensate for the output nonlinearity of the sensor to achieve sensor input and output characteristic linearization

Method used

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  • Intelligent test system based on TEDS sensor and matrix switch technology and test method thereof
  • Intelligent test system based on TEDS sensor and matrix switch technology and test method thereof
  • Intelligent test system based on TEDS sensor and matrix switch technology and test method thereof

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Embodiment 1

[0049] Embodiment one An Intelligent Test System Based on TEDS Sensor and Matrix Switch Technology

[0050] The present embodiment is an intelligent test system based on TEDS sensor and matrix switch technology, such as figure 2 As shown, it includes:

[0051] (1) Signal conditioning automatically configures the matrix switch module, which is used to transmit the signal collected by the external TEDS sensor to the corresponding signal conditioning module. The signal conditioning in this embodiment automatically configures the matrix switch module such as Figure 4b As shown, its topological structure is (L×M)×N, that is, there are LⅹM rows and N columns of switching channels, and the intersection of each row and each column is a switching channel, and each column of channels (c 0 to c N-1 The channel in ) corresponds to the only external TDES sensor, that is, the information collected by each TEDS sensor can only be transmitted through a unique column channel; and each r...

Embodiment 2

[0062] Embodiment two A testing method of intelligent testing system based on TEDS sensor and matrix switch technology

[0063] A kind of test method utilizing above-mentioned intelligent test system based on TEDS sensor and matrix switch technology, such as Figure 5 The following steps are shown:

[0064] (1) Read TEDS information: the control module sequentially reads and scans the TEDS information of the sensors connected to the measured object through the channels of the TEDS matrix switch automatic configuration module.

[0065] The TEDS information of the sensor in this embodiment includes basic TEDS information and standard TEDS information, wherein the basic TEDS information contains necessary sensor identification information, that is, identification parameters, such as manufacturer, serial number, version number and data code. The standard TEDS information includes sensor-specific "data sheet" information, generally the data required to correctly configure the el...

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Abstract

The invention discloses an intelligent test system based on a TEDS sensor and a matrix switch technology and a test method thereof. The test process of the test system comprises the following steps that (1) sensor TEDS information is read; (2) a conditioning module group is automatically configured; (3) automatic switching of channels is acquired; (4) sensor data are nonlinearly corrected; and (5) the data are parsed. The detection process is simple without artificial input of the sensor information or artificial replacement of the conditioning module and switching of the test channels so that detection efficiency is greatly enhanced. The intelligent test system is suitable for automatic conditioning and automatic testing of sensor output signals after intelligent reconstruction.

Description

technical field [0001] The invention belongs to the field of automatic test systems, and relates to an intelligent test system, specifically an intelligent test system based on TEDS sensor and matrix switch technology, and simultaneously the present invention also relates to the non-linearity of sensor data of the above-mentioned system based on sensor TEDS information correction technique. Background technique [0002] Traditional test systems such as figure 1 shown. Including: measured object, sensor, conditioning module, data acquisition module, computer-based control system and display platform. The sensor is responsible for converting the measured physical quantity into an electrical parameter that is easier to handle; the conditioning module is responsible for converting the electrical signal into a voltage signal that meets the system requirements; the data acquisition module is responsible for converting the analog signal into a discrete binary digital signal that ...

Claims

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Application Information

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IPC IPC(8): G01D21/00G01D3/028
Inventor 邓士杰唐力伟于贵波丁超苏续军张礼学张林锐
Owner PEOPLES LIBERATION ARMY ORDNANCE ENG COLLEGE
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