Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Ultraviolet illumination DIC (digital image correction)-based mechanical property loading measuring system and method for high-temperature material

A technology of mechanical properties and high-temperature materials, which is applied in the direction of applying stable tension/pressure to test the strength of materials, measuring devices, and analyzing materials. Harsh requirements and other issues to achieve the effect of avoiding thermal radiation interference, reducing test difficulty, and real-time accurate measurement

Active Publication Date: 2015-04-22
HEFEI UNIV OF TECH
View PDF7 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] First, there is no full-field deformation measurement technology suitable for high temperatures above 1000 °C;
[0004] Second, the traditional contact deformation measurement method can only achieve single point or average deformation information, and cannot obtain the whole field information
In the non-contact full-field optical measurement method, the laser speckle interferometry method (ESPI) is not only demanding on the environment, but also cannot be measured when the material is red due to high temperature;
[0005] The third is that the traditional method cannot realize that the high-temperature furnace and the stretching machine cooperate to carry out force loading while heating. At the same time, the temperature sensor of the high-temperature furnace itself measures the temperature of the gas in the furnace. There is a temperature difference between them, so the temperature measured by the temperature sensor is not the temperature of the measured material;
Therefore, under this high temperature condition, ordinary monochromatic lighting sources (such as 450nm blue light) and filtering can no longer detect useful information from the sample reflection spectrum.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Ultraviolet illumination DIC (digital image correction)-based mechanical property loading measuring system and method for high-temperature material
  • Ultraviolet illumination DIC (digital image correction)-based mechanical property loading measuring system and method for high-temperature material

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In this embodiment, the method for measuring the mechanical properties of high-temperature materials based on ultraviolet illumination DIC is: for the tested sample in a set temperature environment and in a set loading state, project an ultraviolet light source with a wavelength of less than 380nm on the The surface of the tested sample; use the ultraviolet sensitive image acquisition module to carry out image acquisition on the surface of the tested sample 11, and obtain each collected image corresponding to the surface of the tested sample at different temperatures, at different times, and under different loading forces, by Each collected image is subjected to DIC image processing to obtain the full-field thermal deformation information of the surface of the tested sample.

[0029] The measurement method in this embodiment is suitable for the measurement process in which the temperature environment is 1000°C to 3000°C.

[0030] see figure 1 , the system composition ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an ultraviolet illumination DIC (digital image correction)-based mechanical property loading measuring system and method for a high-temperature material. The measuring system is characterized by comprising the following steps: projecting an ultraviolet light source on the surface of a to-be-measured sample which is in a set temperature environment and in a set loaded state; and collecting images of the surface of the to-be-measured sample by using an ultraviolet sensitive image collection module to acquire collection images on the surface of the to-be-measured sample, corresponding to different temperatures, moments and loading forces, and carrying out DIC image processing on the collected images to acquire full-field thermal deformation information of the surface of the to-be-measured sample. The system and the method disclosed by the invention can be used for effectively achieving the non-contacted measurement of full-field strain of the material with the temperature being over 1000 DEG C.

Description

technical field [0001] The invention relates to a mechanical performance measurement system and a measurement method for full-field deformation under the force and thermal load on the surface of a high-temperature object, which are applied to the measurement of strain and deformation under high-temperature conditions in various fields such as machinery manufacturing, aerospace, and materials. Measurement. Background technique [0002] Accurate measurement of the mechanical properties of high-temperature materials under high-temperature conditions is crucial to the reliability assessment, life prediction and safety design of aerospace vehicle materials and structures. Obtaining deformation and strain field information on the surface of materials at high temperatures is of great importance to it. The key and foundation of mechanical properties research. In the prior art, the following problems exist in the measurement of the mechanical properties of high-temperature materials...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N3/02G01N3/06G01N3/18G01B11/16
CPCG01B11/16G01N3/02G01N3/068G01N3/18
Inventor 王永红张浩陈李安东丁一飞杨连祥
Owner HEFEI UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products