Automatic test system for implementing synchronous bidirectional triggering by using embedded controller and automatic test method for implementing bidirectional triggering by using automatic test system

Abstract

The invention discloses an automatic test system for implementing synchronous bidirectional triggering by using an embedded controller and an automatic test method for implementing bidirectional triggering by using the automatic test system. The automatic test system comprises the embedded controller as a triggering source, and a back plate and a front panel which are connected with the embedded controller respectively, wherein the back plate is further connected with a modularized instrument in a machine cabinet; the front panel is further connected with another external instrument or system; the embedded controller comprises a programmable logic chip; a bidirectional triggering mode predominated by software is added into a triggering mode register of a software and hardware interface defined in the programmable logic chip; in the mode, a triggering command is generated by the software, and a triggering signal is sent to the back plate and the front panel synchronously and further transmitted to the modularized instrument inside the machine cabinet and the another external instrument or system. The method is the method for implementing the bidirectional triggering by using the automatic test system. The triggering signal generated by the software is sent to the modularized instrument and the external instrument synchronously, so that the modularized instrument and the external instrument can be triggered at higher precision.

Description

technical field [0001] The invention relates to an automatic test system and method, in particular to an automatic test system and method which utilize an embedded controller for simultaneous bidirectional triggering. Background technique [0002] In the existing embedded controller products on the market, in order to cooperate with other instruments or systems in the process of testing and measuring, it is necessary to provide a trigger interface on the front panel to introduce external trigger signal, or output the internally generated trigger signal to other external instruments or systems. [0003] In the existing automated test systems on the market, the embedded controller is used as the core control unit, and its trigger function is set through the software in the embedded controller to completely realize the input or output trigger signal. The currently implemented trigger functions are mainly divided into the following three categories, one is as follows: figure 1...

AI Technical Summary

Problems solved by technology

In this case, when it is necessary to trigger the modular instrument inside the case to work with the external desktop instrument or system, if the existing trigger method is used, whether it is to output the trigger signal from the inside of the case to the external instrument, or use External instruments are used to generate trigger signals. Since the trigger signals need to pass through the embedded controller first for processing and forwarding, a certain delay will inevitably be introduced. Therefore, there will always be a problem of low trigger accuracy in technology, which eventually leads to The triggering time of the modular instrument inside the chassis and other instruments or systems outside the chassis is inconsistent, and better measurement results cannot be obtained

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