Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Columnar diode surface defect detection device based on machine vision

A columnar diode and defect detection technology, applied in the direction of optical testing defects/defects, etc., can solve the problems of missing texture information, high cost, immature monocular/binocular stereo vision, etc., and achieve the effect of uniform light receiving

Inactive Publication Date: 2015-05-06
DONGHUA UNIV
View PDF4 Cites 20 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The latter is subdivided into two types of methods, namely, image-based methods and geometry-based methods. Image-based monocular / binocular stereo vision is not mature, takes a long time, and is not suitable for real-time online detection.
Geometry-based laser scanning can obtain the depth data of the object to build a 3D model, with high accuracy and real-time performance, but the disadvantage is that the texture information is lost and the cost is high

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Columnar diode surface defect detection device based on machine vision
  • Columnar diode surface defect detection device based on machine vision
  • Columnar diode surface defect detection device based on machine vision

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] In order to make the present invention more comprehensible, preferred embodiments are described in detail below with accompanying drawings. It should be understood that these examples are only used to illustrate the present invention and are not intended to limit the scope of the present invention. In addition, it should be understood that after reading the teachings of the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms also fall within the scope defined by the appended claims of the present application.

[0032] combine image 3 , the present invention provides a machine vision-based columnar diode surface defect detection device, which is characterized in that it includes a conveyor belt 1 for transporting diodes, and an industrial camera-2 for taking images of the front of the diodes is provided above the conveyor belt 1. The bottom of the conveyor belt 1 is provided with an ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses hardware and software algorithm designs of a columnar diode surface defect detection device. The hardware design comprises the steps of industrial camera selection, lens selection and optical platform establishment. The defect detection algorithm design of the software comprises the steps of tube body segmentation, tube body pretreatment, defective ROI segmentation, feature extraction, and decision tree classifier design. Aiming at the optical platform design, a reasonable illumination manner and a reasonable light source placement manner are tested through the optical principle and the structural properties of the object. Aiming at the design of a defect detection operator, the difficulty lies in the defective ROI segmentation and the texture feature extraction, and improved stroke width conversion and patterned gradient histogram feature extraction methods are proposed respectively; finally, the defects are classified through a decision tree classifier, the defect decision tree classifier recognition rate is close to 100%, the classification success rate reaches 96.2% and good recognition and classification results are achieved.

Description

technical field [0001] The invention relates to a hardware device and a software method for detecting surface defects of a columnar diode. Background technique [0002] At present, most of the measured objects of machine vision are planar structures with high consistency in shape and texture, such as SMT surface mount, wafer defect detection, etc. With the further improvement of the degree of automation, higher requirements are placed on the adaptability of the visual system, and more excellent feature operators and machine learning-based classifiers are required to ensure that the system has a more comprehensive and intelligent learning of complex objects. and know. [0003] For a three-dimensional structure object, the surface texture is distributed around, and the spatial position, shape feature and gray level feature of the defect have great uncertainty, and it may appear that the normal texture is mixed with the defect, and different defects are mixed, increasing the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/89
Inventor 张中炜郭朝伟姚意谭志军陈梦云
Owner DONGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products