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Analysis setting device and processing device as well as analysis setting method and processing method

A technology of analysis area and analysis mode, which is applied in the field of analysis and setting devices, can solve problems such as high user requirements, difficulty in batch analysis of multi-frame thermal image data, and error-prone

Active Publication Date: 2015-05-27
MISSION INFRARED ELECTRO OPTICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The analysis area with the same analysis area number may correspond to different parts of the thermal image of the subject, which can easily bring about a series of difficulties in subsequent analysis, such as the difficulty of unifying the analysis mode and diagnosis rules for similar subjects. For example, it is difficult to batch process and analyze multi-frame thermal image data, and it is easy to cause confusion in the analysis and diagnosis results, etc.
[0007] As a result, under the existing technology, in order to standardize the setting of the analysis area, the user currently needs to manually adjust or set the number of the analysis area, adjust image 3 (b) Analyze the area number, the operation is extremely cumbersome and error-prone
[0008] or according to image 3 (b) It is also extremely tedious work to arrange the analysis mode again by analyzing the area number in (b); the setting workload of the analysis mode is heavy. Very demanding users

Method used

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  • Analysis setting device and processing device as well as analysis setting method and processing method
  • Analysis setting device and processing device as well as analysis setting method and processing method
  • Analysis setting device and processing device as well as analysis setting method and processing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0046] Embodiment 1 uses a portable thermal imaging device 13 with a shooting function as an example of an analysis setting device. refer to figure 1 The structure of the thermal imaging device 13 of the first embodiment will be described.

[0047] The thermal imaging device 13 has a photographing part 1, an image processing part 2, a display and control part 3, a display part 4, a communication I / F5, a temporary storage part 6, a memory card I / F7, a memory card 8, a flash memory 9, an operation part 10, The control unit 11 is responsible for overall control of the thermal imaging device 13 by connecting the control and data bus 12 with the above corresponding parts.

[0048] The imaging unit 1 is composed of unillustrated optical components, lens driving components, infrared detectors, signal preprocessing circuits, and the like. The optics consist of an infrared optical lens for focusing the received infrared radiation onto the infrared detector. The lens driving part dr...

Embodiment 2

[0110] In Embodiment 1, part information can be used for all subjects, which brings problems such as, when there are many subjects to be photographed, there may be a lot of part information to be selected; and the user may operate The part of the subject that needs to be set is omitted in the Embodiment 2 takes a portable thermal imaging device 13 with a shooting function as an example of an analysis setting device.

[0111] In Embodiment 2, the subject information selection unit is used to select subject information; store (at least one) subject information, part information associated with the subject information, or part information associated with the part information in the storage medium. Analyzing area composition data and / or analyzing area position parameters, etc.; in this way, based on the subject information corresponding to the subject indication information selected by the user according to the on-site subject, the part information display control unit, according ...

Embodiment 3

[0125] Embodiment 3 uses a portable thermal imaging device 13 with a shooting function as an example of a processing device. The processing device includes an acquisition unit for acquiring thermal image data; an analysis unit for analyzing information related to part information associated with the thermal image data, and information related to the corresponding analysis area; an analysis area setting unit, It is used to set the analysis area according to the information related to the analysis area analyzed by the analysis unit; the analysis unit is used to obtain the analysis result according to the specified analysis mode; wherein, preferably, the analysis is obtained according to the analysis mode corresponding to the part information. result.

[0126] The specific operation and control flow of Embodiment 3 will be described in detail below. In this application scenario, for example, the subject of the substation is photographed. During the shooting, by selecting the par...

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PUM

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Abstract

An analysis setting apparatus, a processing apparatus, an analysis setting method, and a processing method, which relate to the application field of thermal image analysis. In the prior art, when different operation sequences are set for analysis regions, portions of a photographed object of analysis regions with a same number may be inconsistent, which is high likely to bring a series of difficulties in follow-up analysis. By means of the analysis setting apparatus, the processing apparatus, the analysis setting method and the processing method, an analysis region is determined according to a selected region, and information related to portion information is associated with the analysis region. In this manner, a set analysis region is easy to be regulated, thereby solving an existing technical problem.

Description

technical field [0001] The analysis setting device, processing device, analysis setting method, and processing method of the present invention relate to the application field of thermal image detection. Background technique [0002] When it is necessary to analyze the thermal image of the subject, the user can set an analysis area for points, lines, surfaces, etc. of a specific part of the thermal image of the subject to obtain the analysis result. The setting method of the analysis area in the prior art is, for example, image 3 As shown in (a), the analysis area selection column XZ3 is displayed on the display screen of the thermal imaging device, and the user can select the analysis area of ​​points, lines, frames, etc. to form data from the selection column XZ3, and then according to the displayed infrared heat The thermal image of the subject in the image corresponds to the analysis part to set the position parameters of the analysis area, so as to set and obtain one or...

Claims

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Application Information

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IPC IPC(8): G01J5/10
CPCG01N25/72H04N5/33G01J5/48Y02P90/30
Inventor 王浩
Owner MISSION INFRARED ELECTRO OPTICS TECH