Embedded device CPU (Central Processing Unit) bus fault injection test system and test method

Abstract

The invention provides an embedded device CPU (Central Processing Unit) bus fault injection test system and a test method. The system comprises an upper computer platform, a fault injection host computer, a fault injection probe and a tested device, wherein the upper computer platform mainly operates fault injection software and the like; the fault injection host computer has the parameter functions of uploading data and issuing commands between an Ethernet network and the upper computer platform; the fault injection probe provides different CPU interface functions, and different probes are replaced for different CPUs; tested software is mainly operated in the tested device, and all signals of the tested device are connected with the fault injection probe through interfaces. According to the embedded device CPU bus fault injection test system and the test method, through the upper computer platform, fault setting parameters are set and fault injection commands are issued, a plenty of fault injection types can be carried out through parameter combination, the comprehensive fault injection type requirement of an embedded system is met, and the use is flexible and convenient.

Description

technical field [0001] The invention relates to a test system and a test method thereof, in particular to an embedded device CPU bus fault injection test system and a test method. Background technique [0002] High-reliability embedded systems require complete testing, including white box, black box, performance, and functional testing. But there is another very important test, which is the fault injection test. There are many types of faults, and it is not easy to simulate various faults, so it is often difficult to obtain sufficient simulations, such as lightning, strong interference from the enemy, etc. Such faults have very large uncertainties. Contents of the invention [0003] For the defect in the prior art, the purpose of the present invention is to provide a kind of embedded equipment CPU bus fault injection test system and test method, it sets the fault setting parameter by the upper computer platform, issues the fault injection instruction, can carry out by par...

AI Technical Summary

Problems solved by technology

There are many types of faults, and it is not easy to simulate various faults, so it is often difficult to obtain sufficient simulations, such as lightning, strong interference from the enemy, etc. Such faults have very large uncertainties

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