Method for computing position deviation of pixels of CCD (charge coupled device)

A technology of deviation calculation and pixel position, applied in the field of star sensors

Active Publication Date: 2015-07-22
NAT SPACE SCI CENT CAS
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, if the position deviation of CCD pixels can be calculated, the attitude measurement accuracy can be increased several times or even an order of magnitude without increasing the hardware resources of the star sensor. Therefore, measuring the position deviation of CCD pixels is very important for the development of advanced star sensors. There is an urgent need, and there is no effective method in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for computing position deviation of pixels of CCD (charge coupled device)
  • Method for computing position deviation of pixels of CCD (charge coupled device)
  • Method for computing position deviation of pixels of CCD (charge coupled device)

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] The present invention will be further described now in conjunction with accompanying drawing.

[0063] refer to figure 1 , CCD pixel position deviation calculating method of the present invention comprises the following steps:

[0064] Step 1), using the CCD pixel position deviation measurement device to generate a group of longitudinal dynamic interference fringes on the surface of the CCD, and the CCD is exposed at a fixed frame rate for a period of time to generate multiple groups of longitudinal dynamic interference fringe images;

[0065] Step 2), process the longitudinal dynamic interference fringe image obtained in step 1), and obtain the phase of the output of each pixel at the same moment;

[0066] Step 3), using the phases of all pixels at the same moment obtained in step 2), and calculating the phase difference between each pixel and the first pixel at the same moment in combination with the moving direction of the longitudinal dynamic interference fringes; ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a method for computing position deviation of pixels of a CCD (charge coupled device). The method includes generating a group of longitudinal dynamic interference fringes on the surface of the CCD, and exposing the CCD at fixed frame frequencies within a period of time to generate a plurality of groups of longitudinal dynamic interference fringe images; processing the longitudinal dynamic interference fringe images to obtain phases of output of the pixels at the same moment; computing phase difference between the pixels and first pixels at the same moment by the aid of combinations of the phases and movement directions of the longitudinal dynamic interference fringes; acquiring wave vectors of the longitudinal dynamic interference fringes and transverse position deviation of all the pixels by means of computation by the aid of combinations of the phase difference and the sizes of the pixels of the CCD; solving the longitudinal position deviation of all the pixels. The method has the advantages that dynamic interference fringe data are effectively utilized, accordingly, the phases of all the pixels at the same moment can be accurately computed, and the high-precision position deviation of the pixels can be obtained.

Description

technical field [0001] The invention relates to the field of star sensors, in particular to a method for calculating CCD pixel position deviation. Background technique [0002] The star sensor is an important instrument in the field of satellite attitude measurement. It is a sensitive device for attitude measurement with stars as a reference object, and a photoelectric conversion measurement system with light sensitive elements as the core. It recognizes the star map by measuring the angular distance between star point images, so as to determine the satellite attitude according to its position relative to the stars on the celestial sphere. The centroid positioning accuracy of the star point image is the key factor to determine the attitude measurement accuracy. [0003] At present, the center of mass positioning in the star sensor is mostly completed by Gaussian fitting or direct calculation of the center of gravity. At present, people only consider the quantum efficiency ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00
Inventor 李保权曹阳李海涛
Owner NAT SPACE SCI CENT CAS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap