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Method of manufacturing depletion type double-diffused metal oxide semiconductor

A technology of oxide transistor and fabrication method, applied in semiconductor/solid-state device manufacturing, semiconductor device, electrical components, etc., can solve the problem of high production cost

Inactive Publication Date: 2015-08-12
PEKING UNIV FOUNDER GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

but from figure 1 and figure 2 It can be seen from the figure that there are differences in the cellular structure of the enhanced type and the depleted type, so the production process will also be different. Two sets of production lines require two sets of production equipment, and the production cost is relatively high.

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  • Method of manufacturing depletion type double-diffused metal oxide semiconductor
  • Method of manufacturing depletion type double-diffused metal oxide semiconductor
  • Method of manufacturing depletion type double-diffused metal oxide semiconductor

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Embodiment Construction

[0023] In order to understand the above-mentioned purpose, features and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other.

[0024] In the following description, many specific details are set forth in order to fully understand the present invention, but the present invention can also be implemented in other ways different from those described here, therefore, the present invention is not limited to the specific embodiments disclosed below limit.

[0025] image 3 A flow chart of a method for fabricating a depletion-type double-diffused metal oxide transistor according to an embodiment of the present invention is shown.

[0026] Such as image 3 As shown, the method for manufactur...

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Abstract

The invention provides a method of manufacturing a depletion type double-diffused metal oxide semiconductor (DMOS), comprising: employing a polycrystalline silicon photomask to inject P type doping elements into an N-EPI after generating the N-EPI on an N-sub so as to form P type body regions; injecting N type doping elements into the N-EPI to from N type channels on the surfaces of the P type body regions; growing gate oxide on the N-EPI provided with the N type channels, and growing a polycrystalline silicon layer on the gate oxide; performing photoetching and etching on the polycrystalline silicon layer to form a polycrystalline silicon window and to expose to the N type channels; and injecting doping elements into the N type channels through the polycrystalline silicon window to form source areas. According to the invention, the method employs the polycrystalline silicon photomask twice and utilizes the enhanced DMOS production process to generate a depletion type DMOS; the production process is completely compatible with a present DMOS production process, and is relatively simple.

Description

technical field [0001] The invention relates to the field of semiconductor devices and their manufacturing techniques, in particular to a method for manufacturing a depletion-type double-diffused metal oxide transistor. Background technique [0002] Among the currently used DMOS transistors (Double-diffused Metal Oxide Semiconductor, double-diffused metal oxide semiconductor transistors), the common types can be divided into two types: enhancement type and depletion type, and the structure of the N-channel enhancement type DMOS cell is as follows figure 1 As shown, the structure of the N-channel depletion DMOS cell is as figure 2 shown. Taking the N-channel MOS transistor as an example, the enhanced MOS transistor does not have a conductive channel at zero gate bias voltage, and cannot conduct electricity. The channel is normally closed and can only be formed when the gate bias voltage is positive (greater than the turn-on voltage). The channel is conductive; while the de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/336
CPCH01L29/66712H01L29/7802
Inventor 蔡远飞何昌姜春亮
Owner PEKING UNIV FOUNDER GRP CO LTD