On-chip antenna electrical property test system and method

Abstract

The invention provides an on-chip antenna electrical property test system. A millimeter wave test system comprises a vector network analyzer, a millimeter wave controller, a triplexer, a millimeter wave receiving module, and an S parameter test module, and realizes signal generation and receiving measurement. A millimeter wave probe is in connection with the output port of the S parameter test module through a waveguide tube; a probe bench system and a microscope system are in mutual cooperation to realize reliable contact between a probe contact and an on-chip antenna feeding point; a three-shaft rotary table system comprises a lower orientation rotary table, a first L-shaped cantilever, a second L-shaped cantilever, a pitching rotary table, an upper orientation rotary table and a rotary table controller; the millimeter wave receiving module is installed above the three-shaft rotary table system; the input port of the millimeter wave receiving module is provided with a horn receiving antenna which aligns the on-chip antenna at the centre of sphere; a master control computer controls a whole system. The on-chip antenna electrical property test system can accurately measure the standing-wave ratio, directional diagram characteristics and gains of an on-chip antenna.

Description

technical field [0001] The invention relates to the technical field of microwave testing, in particular to an electrical performance testing system of an on-chip antenna, and also relates to an electrical performance testing method of an on-chip antenna. Background technique [0002] With the rapid development of electronic information technology, communication technology and integrated circuit technology, current wireless communication systems, especially high-speed short-distance wireless communication systems, are developing towards higher frequency bands. As the frequency increases, the wavelength becomes shorter and shorter, and the size of the corresponding device can be smaller, so the system on a chip has been rapidly developed and applied. [0003] The traditional antenna test technology is aimed at various types of antennas with standard interfaces such as coaxial and waveguide, but this type of test technology is not suitable for testing various on-chip antennas w...

AI Technical Summary

Problems solved by technology

[0010] The invention discloses an electrical performance testing system and method of an on-chip antenna. Through a testing method of an on-chip antenna based on probe feeding and an "L"-shaped cantilever turntable, the clamping of various on-chip antennas is solved. , feeding, testing and calibration, etc., can realize accurate testing of electrical performance parameters such as on-chip antenna standing wave ratio, main polarization and cross polarization pattern, stereo pattern and gain

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