Small detail feature size measurement method in industrial CT inspection
A technology of detailed features and measurement methods, applied in the direction of using radiation for material analysis, etc., can solve problems such as large errors and differences in CT image quality, and achieve the effect of high measurement accuracy, high recognition, and high flexibility
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[0033] The present invention will be described in further detail below in conjunction with the embodiments of the drawings.
[0034] In this embodiment, a specific example is used to describe the method for measuring the feature size of small details in industrial CT detection.
[0035] The scanning device used in this embodiment: IPT6110 6MeV high-energy industrial CT system, the ray source focal point size is a=2mm; the single detector channel size d=0.3mm, and the detector channel interval h=1.3mm.
[0036] Workpiece to be inspected: The test piece is a round piece with a diameter of 40mm and a thickness of 0.2mm. The material is stainless steel. There is an artificial hole with a diameter of 0.3mm on the 2 / 3 radius of the test piece from the center. This artificial hole is a simulated detail feature.
[0037] Scanning process parameters: the distance between the ray source and the detector L=3400mm, the distance between the ray source and the center of the workpiece turntable q=313...
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