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Small detail feature size measurement method in industrial CT inspection

A technology of detailed features and measurement methods, applied in the direction of using radiation for material analysis, etc., can solve problems such as large errors and differences in CT image quality, and achieve the effect of high measurement accuracy, high recognition, and high flexibility

Active Publication Date: 2017-09-12
CHINA WEAPON SCI ACADEMY NINGBO BRANCH
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Problems solved by technology

In fact, with different scanning processes, the quality of CT images varies greatly, especially for image information such as the shape and pixel value of detailed features (small defects).
Therefore, the measurement method of detailed features (small defects) only for CT scan images without considering the scanning process parameters is one-sided, and the error is too large

Method used

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  • Small detail feature size measurement method in industrial CT inspection
  • Small detail feature size measurement method in industrial CT inspection
  • Small detail feature size measurement method in industrial CT inspection

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Embodiment Construction

[0033] The present invention will be described in further detail below in conjunction with the embodiments of the drawings.

[0034] In this embodiment, a specific example is used to describe the method for measuring the feature size of small details in industrial CT detection.

[0035] The scanning device used in this embodiment: IPT6110 6MeV high-energy industrial CT system, the ray source focal point size is a=2mm; the single detector channel size d=0.3mm, and the detector channel interval h=1.3mm.

[0036] Workpiece to be inspected: The test piece is a round piece with a diameter of 40mm and a thickness of 0.2mm. The material is stainless steel. There is an artificial hole with a diameter of 0.3mm on the 2 / 3 radius of the test piece from the center. This artificial hole is a simulated detail feature.

[0037] Scanning process parameters: the distance between the ray source and the detector L=3400mm, the distance between the ray source and the center of the workpiece turntable q=313...

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Abstract

The invention relates to a method for measuring the size of small detail features in industrial CT detection. In the CT image of a detected workpiece obtained by scanning, a detail feature area containing detail features and a reference area without obvious defects are selected, and the detail feature area and the reference area are respectively measured. Calculate the CT value of the pixel, and then calculate the difference between the CT value of each pixel in the detailed feature area and the average CT value of all pixels in the reference area, and the equivalent standard deviation value of each pixel in the detailed feature area. , when the ratio value is greater than 3, the pixel is considered to be a detail feature point, and then the number of detail feature points is accumulated to obtain the area of ​​the detail feature point. After conversion, the equivalent circle diameter is obtained, and the effective beam width value is subtracted. The diameter of the detailed feature area can be obtained. The method for measuring the feature size of small details in industrial CT detection is flexible in application, and has high recognition and measurement accuracy.

Description

Technical field [0001] The invention relates to a method for measuring the feature size of small details in industrial CT detection. Background technique [0002] Industrial CT (industrial computerized tomography) is the abbreviation of industrial computerized tomography technology, which can clearly, accurately and intuitively display the internal structure, composition, material and defect status of the detected object. It is mainly used for non-destructive testing and non-destructive evaluation. Industrial CT technology is widely used in industries such as automobiles, materials, railways, aerospace, aviation, military industry, and national defense. [0003] Products used in aviation, aerospace, military, and national defense have high quality requirements. For example, electron beam welding technology is used in welding seam processing. After welding, industrial CT is used to inspect the quality of electron beam welding seam. The quality acceptance is implemented in GJB1718A-...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/04
Inventor 张维国倪培君郭智敏徐向群齐子诚乔日东左欣
Owner CHINA WEAPON SCI ACADEMY NINGBO BRANCH