ESD detection method and device, and ESD debugging method and device

Abstract

An ESD detection method, device, and ESD debugging method and device. The ESD detection method includes: receiving an input file; extracting a netlist corresponding to a layout file through a technical tool file; detecting the setting of a circuit unit mounted on a power line in the netlist The type of ESD protection device; by detecting the distribution coordinates of the device in the circuit unit of the netlist, the distribution range of each circuit unit in the netlist is obtained; the ratio of the distribution range of each circuit unit to the distribution range of the top-level circuit unit in the netlist is calculated; when the ratio is greater than Or when being equal to the first preset value, determine whether the circuit unit includes a core device, and judge whether the ESD protection device type is an ESD protection device suitable for a core device; when the ESD protection device type is not suitable for an ESD protection device for a core device , to determine that the circuit violates the ESD design rule; when the ratio is smaller than the first preset value, it is detected whether the circuit unit contains a core device. The method and apparatus reduce detection time.

Description

technical field [0001] The invention relates to electronic equipment detection technology, in particular to an ESD detection method and device, and an ESD debugging method and device. Background technique [0002] Chips are affected by Electro-Static Discharge (ESD) during the entire manufacturing process. When the external environment of the chip or the static charge accumulated inside the chip flows into or out of the chip through the chip pins, a peak current or voltage will be generated in a very short time, causing serious damage to the chip, such as temporary loss of function or permanent damage . In addition, ESD may also absorb dust, shorten the life of the chip, or generate electromagnetic interference, affecting the normal operation of the chip. Therefore, the ESD detection of chips has become an important task in the process of chip development. [0003] There are many components of a chip, and a cutting-edge chip may include more than 1,000,000,000 devices, oc...

AI Technical Summary

Problems solved by technology

There are few disclosures about the existing automatic programming inspection method for the completeness of the on-chip (on-chip) ESD protection circuit on the whole chip, and the inspection is usually only performed at the device level, so it takes a very long time to complete the inspection. Full-chip ESD detection, low detection efficiency

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