Thyristor chip gate testing tool

Abstract

The present invention discloses a thyristor chip gate testing tool which comprises a test fixture which comprises a base, a butterfly locator, a gate ejector pin, a cathode ejector pin, a cathode ejector pin moving component. The butterfly locator is above the base and is provided with a chip clamp groove for placing a chip to be tested. Both the cathode ejector pin and the gate ejector pin are installed in the base and are under the butterfly locator. The gate ejector pin is at the middle part of the base and is fixed. The chip clamp groove is provided with a gate matched hole which is matched with the gate ejector pin. The cathode ejector pin is installed on the cathode ejector pin moving component and can move along the radial direction of the butterfly locator under the driving of the cathode ejector pin moving component. The chip clamp groove is provided with a cathode ejector pin moving groove for the movement of the cathode ejector pin along a radial direction. The thyristor chip gate testing tool has the advantages of simple and compact structure, easy manufacture, convenient operation, and the improvement of testing efficiency and testing effect.

Description

technical field [0001] The invention mainly relates to the field of thyristor chips, in particular to a tool for gate testing of the thyristor chips. Background technique [0002] The gate parameter I of the thyristor chip GT , V GT It is an important parameter of thyristor. like figure 1 Shown is the industry standard used to test the gate trigger current I GT and trigger voltage V GT The schematic diagram of the circuit principle. It can be seen from the schematic diagram of the test circuit that the gate trigger current I GT , gate trigger voltage V GT The test needs to apply an electrical signal between the gate and cathode of the tested die, and a specified off-state voltage must also be applied between the cathode and anode of the tested die. In order to perform the test, contact parts are required to give the gate, cathode, and anode signals respectively. Therefore, in order to obtain the gate trigger current I of the thyristor die GT and trigger voltage V ...

AI Technical Summary

Problems solved by technology

[0004] (1) Poor contact of the thimble: the thimble is easy to age, and after a period of use, it cannot reach 100% good contact with the gate of the die;

[0005] (2) Inaccurate centering: There is no positioning point in the tooling, and the test of gate alignment to the core of the tube is completely based on hand feeling, the accuracy rate is not high, and the efficiency is low;

[0006] (3) Easy to scratch the core: the test requires both hands to operate the test at the same time, the left hand holds the thimble, and the right hand takes the core. Improper rhythm will scratch the surface of the core

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