Circuit life prediction method based on accelerated degradation path

Abstract

The invention discloses a circuit life prediction method based on an accelerated degradation path. The method comprises the following steps: providing a plurality of components to be tested, which are of the same kind, carrying out accelerated degradation experiment on the plurality of components to be tested, and testing and recording performance degradation parameters of the plurality of components to be tested; determining sensitive parameters according to the performance degradation parameters of the plurality of components to be tested, and carrying out stationary processing on sample sequences of the performance degradation parameters of the plurality of components to be tested; obtaining ARIMA model parameters, establishing an ARIMA model according to the performance degradation parameters of the plurality of components to be tested, and updating the ARIMA model into a fitting model of a sensitive parameter path; comparing the fitting model with the sample sequences and judging whether the fitting model is effective, and evaluating fitting precision of the effective fitting model; and predicating the trend of the sensitive parameter path according to the fitting precision, the trend of the sensitive parameter path being predicated result of the circuit life.

Description

technical field [0001] The invention relates to the field of circuit testing, in particular to a method for predicting circuit life based on accelerated degradation tracks. Background technique [0002] As the basic components of all kinds of electronic equipment, the reliability of integrated circuits directly affects the performance and reliability of the entire equipment. Reliability technology plays a very important role in the development of the integrated circuit industry. Being able to evaluate and predict the reliability of products is an integral part of integrated circuit design and production. However, with the continuous development of microelectronics technology and semiconductor manufacturing process level, the reliability level of integrated circuits is getting higher and higher, and the life span is also increasing. It is getting longer and longer, which puts forward higher requirements for the reliability evaluation of integrated circuits, but there is no on...

AI Technical Summary

Problems solved by technology

Being able to evaluate and predict the reliability of products is an integral part of integrated circuit design and production. However, with the continuous development of microelectronics technology and semiconductor manufacturing process level, the reliability level of integrated circuits is getting higher and higher, and the life span is also increasing. It is getting longer and longer, which puts forward higher requirements for the reliability evaluation of integrated circuits, but there is no one in the prior art that can evaluate these components with high reliability and long life in a relatively short period of time. And timely provide relevant reliability information solutions

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