Homemade computer based build in test system and method

A computer and self-inspection technology, applied in the detection of faulty computer hardware, etc., can solve the problems of only offline detection, high ATE cost, complicated operation, etc., achieve stable function and performance, and reduce the effect of false alarm rate

Inactive Publication Date: 2015-12-23
SHANDONG CHAOYUE DATA CONTROL ELECTRONICS CO LTD
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

ATE costs are high, there are many types, the operation is complicated, t

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Homemade computer based build in test system and method
  • Homemade computer based build in test system and method
  • Homemade computer based build in test system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0032] A kind of system based on domestic computer self-detection of the present invention, as figure 1 As shown, the hardware involved in the system includes a system-level test module, a module-level test module, and a chip-level test module; the chip-level test module is used to collect test information from the functional modules of the computer, and upload test information to the module-level test module; The module-level test module is used to receive the test information from the chip-level test module, and upload the test information to the system-level test module; the system-level test module is used to receive the test information from the module-level test module, and in the core processor Carry out diagnostic reasoning and prediction, and display fault and abnormal alarm information;

[0033] Such as figure 2 As shown, the software layers involved in the system include hardware platform layer, driver layer, kernel layer, support layer and application layer; the ...

Embodiment 2

[0035] A kind of system based on domestic computer self-detection of the present invention, as figure 1 As shown, the hardware involved in the system includes a system-level test module, a module-level test module, and a chip-level test module; the chip-level test module is used to collect test information from the functional modules of the computer, and upload test information to the module-level test module; The module-level test module is used to receive the test information from the chip-level test module, and upload the test information to the system-level test module; the system-level test module is used to receive the test information from the module-level test module, and in the core processor Carry out diagnostic reasoning and prediction, and display fault and abnormal alarm information;

[0036] Such as figure 2 As shown, the software layers involved in the system include hardware platform layer, driver layer, kernel layer, support layer and application layer; the ...

Embodiment 3

[0043] The system adopting the above-mentioned self-test of the present invention carries out self-test to domestic computers, including power-on BIT, cycle BIT, and maintenance BIT;

[0044] Power-on BIT: After the system is powered on, the power-on BIT will automatically test after each module is started to determine whether the device is in normal operation;

[0045] Periodic BIT: During the working process of each module, periodic BIT automatically conducts periodic tests and inspections on the modules without interrupting or interfering with the work of the subsystems, so as to ensure the stability of the system's functions and performance and to detect faults in time; Features to diagnose, accurately locate the fault location, store and release fault information;

[0046] Maintenance BIT: During the maintenance process, the maintenance BIT analyzes the fault diagnosis information through the network or through the self-test system software, which is used for hardware fau...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a homemade computer based build in test system and method, which belong to the technical field of computer self-detection and achieve the effects that a build in test (BIT) function of a homemade computer is realized and the demands of a homemade computer platform on possession of fault detection and isolation capabilities and shortening of maintenance time are met. The technical scheme is that: the homemade computer based build in test system and method is provided; hardware involved in the system comprises a system-level testing module, a module-level testing module and a chip-level testing module; and software layers involved in the system include a hardware platform layer, a driver layer, a kernel layer, a support layer and an application layer. The homemade computer based build in test system and method adopts the self-detection system, performs self-detection on the homemade computer, and comprises power-on BIT, periodic BIT and maintenance BIT.

Description

technical field [0001] The invention relates to the technical field of computer self-testing, in particular to a system and method based on domestic computer self-testing. Background technique [0002] With the increasing complexity and technical content of computers, maintainability and testability have an increasingly important impact on the combat capability, survivability, mobility, maintenance personnel, and support costs of computer equipment. In the prior art, the connotation of testability mainly uses automatic test equipment (ATE). [0003] ATE is the abbreviation of Automatic Test Equipment, which is translated as automatic test equipment, which is used to test the integrity of the integrated circuit function of the computer, and is the final process of integrated circuit manufacturing to ensure the quality of integrated circuit manufacturing. In the manufacturing process of all electronic components (Device), there is a need to remove the false and preserve the t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F11/22
Inventor 李娜赵鑫
Owner SHANDONG CHAOYUE DATA CONTROL ELECTRONICS CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products