Leaf area index instrument based on radiation measurement principle

A technology of leaf area index and radiation measurement, which is applied in the direction of measuring devices, instruments, scientific instruments, etc., to achieve the effect of increasing yield

Inactive Publication Date: 2016-01-20
ZHONGYUAN OPTOELECTRONICS MEASUREMENT & CONTROL TECH
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  • Abstract
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  • Application Information

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Problems solved by technology

[0005] The purpose of the present invention is to provide a leaf area index meter based on the radiation measurement principle, to solve the problem that the traditional leaf area index measurement methods all have certain defects

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  • Leaf area index instrument based on radiation measurement principle
  • Leaf area index instrument based on radiation measurement principle
  • Leaf area index instrument based on radiation measurement principle

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Experimental program
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Embodiment Construction

[0027] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0028] The leaf area index meter provided by the invention is a leaf area index meter based on the radiometric principle. The leaf area index meter generally includes a detector and a data processing device, wherein the detector is an optical system for collecting leaf information; the data processing device is used for data processing the information collected by the detector.

[0029] Such as figure 1 As shown, along the order from the object space to the image space, the detector includes a coaxially arranged fisheye lens, a filter and a convex lens. The fisheye lens is used to collect the incident light of the whole field of view. The incident light of the whole field of view includes several incident rays of different zenith angles. For the convenience of use, a level is installed on the shell of the fisheye lens. When the level shows the horizontal pos...

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Abstract

The invention relates to a leaf area index instrument based on the radiation measurement principle. The leaf area index instrument comprises a detector and a data processing device for processing light intensity information collected by the detector. The detector comprises a fish-eye lens, a light filter, a convex lens and a processing circuit which are arranged coaxially. The fish-eye lens is used for collecting full-field incident light. When a horizontal instrument displays the horizontal position, the optical axis of the fish-eye lens is perpendicularly upward. The instrument can obtain leaf area indexes and relative parameters of crops of the region through analytic statistic on the basis of light energy changes, and the leaf area index instrument has the advantage of being capable of precisely and rapidly measuring with no damage. Compared with a direct measurement method, the leaf area indexes can be obtained automatically and more rapidly in a larger range, and workloads are greatly lowered.

Description

technical field [0001] The invention relates to a leaf area index meter based on the radiometric principle. Background technique [0002] At present, the domestic measurement of leaf area index mainly adopts direct harvesting method and fallen leaf collection method. [0003] The direct harvesting method is the traditional method of determining the leaf area index, because this method is to cut down the plants directly, obtain all the leaves on the plant and calculate the area of ​​all the leaves, and then use the ratio of the total leaf area to the vertical shadow of the crown to obtain the leaf area index , the result is more accurate. Although this method can set up sample points in the vegetation area, and then obtain the leaf area index of the entire vegetation area through the measurement of the leaf area index in the sample point, it will destroy the vegetation in a large area, because the method is used in a large area. The accuracy of the measurement is related to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/84
Inventor 吴志刚王艳斌陈涛吴苏朱东红王贝贝刘伟杰黄小龙蒋再扬王一冶金阙艳红李明放裴巧萍李鹏韩振宇李秀红
Owner ZHONGYUAN OPTOELECTRONICS MEASUREMENT & CONTROL TECH
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