Near-field RCS quick measuring method based on high-resolution imaging

Abstract

The invention provides a near-field RCS quick measuring method based on high-resolution imaging, comprising the steps of building a high-resolution near-field imaging model and a dictionary, designing a sparse observation moment, designing a RCS quick measuring path, and finally, carrying out image solving to obtain a target high-resolution image. According to the invention, the measurement efficiency is improved through sparse sampling, and high-resolution imaging is realized based on the theory of compressed perception optimization reconstruction. Because of the adoption of sparse observation and a sparse signal recovery concept, the measurement efficiency is significantly improved, and the problem that near-field RCS measurement is time-consuming and large-scale data obtained through test is difficult to store is solved. Based on an obtained sparse observation signal and a compression perception theory, the traditional imaging mechanism is broken, target high-resolution imaging is realized, and a strong guarantee is provided for nondestructive detection, hidden object detection, and stealth and anti stealth design.

Description

Technical field [0001] The invention relates to the technical field of microwave measurement and microwave imaging, in particular to a near-field measurement and a near-field three-dimensional imaging method. Background technique [0002] Microwave near-field measurement has the advantages of high test accuracy, large amount of information, strong confidentiality, and all-weather work. It is an important method for studying the scattering characteristics of targets. As an effective non-destructive detection and evaluation method, near-field imaging plays an important role in the evaluation of aircraft coatings, spacecraft surface adhesion and other important structures, and the safety detection of hidden objects. The high spatial resolution capability can realize the relative positioning between the sensor and the target, and the system is easy to implement, so it has a wide range of engineering application value. [0003] The traditional near-field planar scanning measurement sys...

AI Technical Summary

Problems solved by technology

[0004] The traditional near-field imaging measurement system achieves high-resolution imaging by acquiring large-scale data. The near-field measurement based on the Nyquist sampling criterion has the problems of high time consumption, low efficiency, and large data storage space. Long measurement time will lead to Accumulation of measurement errors

In addition, the traditional imaging method based on matched filtering technology limits the improvement of imaging resolution, resulting in the inability to accurately describe the target features.

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