Switch matrix test system based on bus transfer

Abstract

The invention discloses a switch matrix test system based on bus transfer. The switch matrix test system comprises a switch matrix and an automatic test device connected with the switch matrix through a measurement channel and an excitation channel. The automatic test device comprises a computer and a control panel connected with the computer. The control panel is in data connection with a data bus. The data bus is in signal connection with a unit under test. The switch matrix is further in control connection with the unit under test. Further included is a programmable power supply being in control connection with the automatic test device. The programmable power supply supplies power for the switch matrix. The invention can be mounted with a plurality of test modules, supports hot plug, has high universality and scalability, does not require the manufacture of a dedicated channel plate for each circuit board under test as compared with a traditional fixed test needle bed, thereby reducing the size and cost, and provides a new implementing means for a low-cost, portable, universal and multi-channel test solution.

Description

technical field [0001] The invention relates to the field of electronic circuits, in particular to a switch matrix test system based on bus transmission. Background technique [0002] Automatic test equipment is more and more widely used in the military and industrial fields. However, in the circuit unit, especially the circuit board test, due to the variety of tested units and the large number of tested channels, the traditional switch matrix is ​​large in size and slow in switching speed. Poor electrical performance. It can no longer meet the high-speed and portable requirements of modern testing instruments. [0003] The switch matrix mainly realizes the information exchange between the automatic test equipment and the circuit unit under test. The signal output by the signal source subsystem of the equipment is transferred to the pin required by the circuit unit under test; (3) The signal output by the circuit unit under test is transferred to the appropriate measuremen...

AI Technical Summary

Problems solved by technology

[0004] In order to overcome the technical defect that the existing technology cannot satisfy the automatic test function of a large number of signal channels, the present invention discloses a switch matrix test system based on bus transmission

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