A Combined Method of Atomic Force Microscopy and Surface Photovoltage Spectroscopy

Abstract

The invention relates to a method for combining an atomic force microscope and a surface photovoltage spectrum, which is used for measuring the surface photovoltage spectrum of a micro-region on a semiconductor surface, and solves the problem that the surface photovoltage spectrum does not have spatial resolution capabilities. The atomic force microscope and the spectrometer can be modulated by a chopper. The variable optical wavelength signal, the surface potential change and the lock-in amplifier are combined to give the surface photovoltage spectrum and phase angle resolution spectrum of the semiconductor micro-region.

Description

technical field [0001] The invention relates to a combined method of atomic force microscope and surface photovoltage spectrum, which is applicable to the surface photovoltage spectrum measurement of micron and nanometer regions on the surface of semiconductor particles. Background technique [0002] Photocatalytic water splitting to produce hydrogen is an important way to develop and utilize solar energy. For solar hydrogen and CO 2 Due to the great demand for reduction, people are developing a series of synthesis methods and assembly strategies for photocatalytic materials, including the modification of nanostructures on the surface of semiconductor catalysts, the directional synthesis of crystal planes, the synthesis of low-dimensional structures, and the construction of heterojunctions / heterojunctions The assembly strategy of co-catalyst and co-catalyst improves the efficiency of photoelectrocatalytic water splitting to a certain extent. However, so far, people's under...

AI Technical Summary

Problems solved by technology

However, the surface photovoltage spectrum lacks spatial resolution, especially when studying the above problems, it involves the distribution of charges in the range of nanometers and micrometers, and the application of surface photovoltage spectroscopy is greatly limited.

The atomic force microscope can obtain nanometer-resolution spatial information, and can also obtain nanometer-resolution electrical signals, such as surface potential, capacitance, etc., but the atomic force microscope itself cannot obtain the information of these signals changing with the excitation wavelength

Images