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Boundary cable position micro-adjustment and cable force measurement device and method for thin-film reflecting surface

A measurement method and technology of a measurement device are applied in the field of fine adjustment of the position of the boundary cable of the reflection surface of the electrostatic forming film and the measurement device of the cable force, which can solve the problem that the tension reading requirement is not required, the screw nut and the bolt nut are difficult to achieve position adjustment, and cannot be intuitively adjusted. It can improve the surface shape of the film and improve the accuracy of the shape and surface.

Active Publication Date: 2016-06-01
XIDIAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The object of the present invention is to provide a device for fine-tuning the boundary cable position and cable force measuring device of the reflective surface of the electrostatically formed film, aiming at solving the problem of existing position fine-tuning mechanisms, such as screw nuts, bolts and nuts, which are mostly difficult to achieve precise position adjustment, and cannot Obtain the adjustment amount intuitively, and at the same time do not have the problem of pulling force reading requirements

Method used

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  • Boundary cable position micro-adjustment and cable force measurement device and method for thin-film reflecting surface

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Embodiment Construction

[0029] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0030] The structure of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0031] The method for fine-tuning the boundary cable position of the electrostatically formed film reflective surface and measuring the cable force according to the embodiment of the present invention includes:

[0032] Before the measurement experiment, it was first considered that the reflective surface of the film is a flexible surface, so it was decided to use a non-contact measurement method to measure the surface accuracy. Secondly, due to the high surface accuracy of the film, the measurin...

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Abstract

The invention discloses a boundary cable position micro-adjustment and cable force measurement device and method for an electrostatic forming thin-film reflecting surface. The boundary cable position micro-adjustment and cable force measurement device for the electrostatic forming thin-film reflecting surface comprises an upper pipe clamp, a lower pipe clamp, a radial micro-adjustment slide block, a vertical micro-adjustment slide block, a radial locking nut, a vertical locking nut, pipe clamp connecting bolts, an S-shaped force sensor, sensor connecting bolts and a punching bolt. The boundary cable position micro-adjustment and cable force measurement device can accurately and reliably achieve radial and vertical position micro-adjustment of a boundary cable, and accurately reads a cable force value of the boundary cable, so that position micro-adjustment and cable force measurement of the boundary cable are achieved; accurate adjustment of the boundary cable position is achieved; the upper pipe clamp and the lower pipe clamp are connected to an antenna truss cross-bar through the bolts; and the boundary cable is connected with the force sensor by the punching bolt. Due to simple working principle and structural features, the boundary cable position micro-adjustment and cable force measurement device has high reliability and maneuverability.

Description

technical field [0001] The invention belongs to the technical field of antenna reflective surfaces, and in particular relates to a device and method for fine-tuning boundary cable positions and measuring cable forces on electrostatically formed film reflective surface. Background technique [0002] The film reflective surface is a new type of antenna reflective surface proposed in recent years. The purpose of reflecting electromagnetic waves is achieved by coating a layer of metal reflective medium on the polyimide film material. The forming method of the film reflective surface is electrostatic stretching. In recent years, research at home and abroad has become a hot topic. Electrostatic stretching is mainly realized by controlling the size and distribution of the potential on the electrode surface. Its structure is simple and its shape is easy to control. The electrostatically formed film antenna is composed of a reflective surface and an electrode surface. The upper part ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01Q3/00H01Q15/14G01D21/02
CPCG01D21/02H01Q3/00H01Q15/14
Inventor 李申李军谢靓杜敬利张逸群杨东武朱日升秦东宾姜文明方栋谷永振李娜杨癸庚丁波
Owner XIDIAN UNIV