An Analysis Method for Laser Blind Via Opening

An analysis method and blind hole technology, which are applied in the direction of material analysis, material analysis, and measurement devices by optical means, can solve the problems of inability to accurately locate, impossible to improve, and inability to guarantee the reliability of HDI products, so as to improve reliability. Effect
CN105651787BActive Publication Date: 2018-08-31GUANGZHOU FASTPRINT CIRCUIT TECH +2

Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
GUANGZHOU FASTPRINT CIRCUIT TECH
Publication Date
2018-08-31

Smart Images

  • Figure 1
    Figure 1
Patent Text Reader

Abstract

The invention discloses an analysis method for opening of a laser blind hole. The analysis method comprises the following steps: S1) preparing a vertical slice for the laser blind hole with invalid opening; S2) observing by a microscope if a crack exists at the bottom of the laser blind hole; S3) if a crack is detected, using a micro-etching fluid for micro-etching a copper surface of the vertical slice and observing the position of the layer on which the crack is located; S4): a) confirming as opening of the laser blind hole caused by the oxidation of the copper surface if the crack is located between plating copper and an electroplate filling hole and no residual glue exists at the bottom of the laser blind hole, and b) confirming as opening of the laser blind hole caused by the oxidation of the copper surface if the crack is located between base copper and the plating copper and no residual glue exists at the bottom of the laser blind hole, and confirming as opening of the laser blind hole caused by the residual glue if the residual glue exists at the bottom of the laser blind hole. According to the analysis method provided by the invention, the reason of opening of the laser blind hole can be accurately acquired, so that the opening problem of the laser blind hole can be solved.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention relates to an analysis method for the open circuit of a laser blind hole. Background technique

[0002] High-density interconnect PCB (HDI) products realize the connection between any layers through laser blind holes, which provides favorable conditions for high-density wiring, high-frequency transmission, and multi-layering. The process of laser blind holes in the PCB manufacturing process is: laser drilling β†’ plasma cleaning β†’ copper sinking β†’ plate plating β†’ electroplating filling holes. The distribution of laser blind holes in HDI is more and more, therefore, the reliability of laser blind holes directly affects the quality of HDI products. However, open-circuit failures often occur in laser blind vias after HDI is heat-treated.

[0003] The traditional open-circuit analysis method of laser blind holes is: simple micro-slice analysis of laser blind holes. Slice analysis can usually only observe cracks at the bottom of blind holes, a...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More