An Analysis Method for Laser Blind Via Opening
Patent Information
- Authority / Receiving Office
- CN Β· China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- GUANGZHOU FASTPRINT CIRCUIT TECH
- Publication Date
- 2018-08-31
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Figure 1
Abstract
Description
technical field
[0001] The invention relates to an analysis method for the open circuit of a laser blind hole. Background technique
[0002] High-density interconnect PCB (HDI) products realize the connection between any layers through laser blind holes, which provides favorable conditions for high-density wiring, high-frequency transmission, and multi-layering. The process of laser blind holes in the PCB manufacturing process is: laser drilling β plasma cleaning β copper sinking β plate plating β electroplating filling holes. The distribution of laser blind holes in HDI is more and more, therefore, the reliability of laser blind holes directly affects the quality of HDI products. However, open-circuit failures often occur in laser blind vias after HDI is heat-treated.
[0003] The traditional open-circuit analysis method of laser blind holes is: simple micro-slice analysis of laser blind holes. Slice analysis can usually only observe cracks at the bottom of blind holes, a...