Method for real-time detection of diffraction phase of structure light field

Abstract

The invention discloses a method for real-time detection of the diffraction phase of a structure light field. The method includes the steps of: utilizing a camera integrated with a pixel polarizing film array to collect fringe patterns generated by interference of reference light beam output through a preset optical path and structured light beam generated by adjustment of a spatial light modulator, the dimensions of each polarizing film unit in the pixel polarizing film array and pixel dimensions of a photosensitive element in the camera being consistent and in one-to-one alignment; and extracting four fringe patterns of different polarization directions from the fringe patterns generated by interference of the structured light and the reference light according to the polarization directions of the polarizing film units so as to calculate the diffraction phase of the structure light field. The method disclosed by the invention realizes real-time measurement of light intensity and phase information of the structure light field, enables a user to deeply know physical characteristics of the structure light field, and has a very large driving function for the structure light field in the fields of optical tweezers, laser micromachining and optical signal propagation.

Description

technical field [0001] The invention relates to the field of wavefront phase measurement of a diffraction light field, in particular to a real-time detection method for the diffraction phase of a structured light field. Background technique [0002] Traditional single-frame camera equipment can only record the light intensity information of the light field by diffracting the plane, but cannot obtain the phase information of the light field. In order to record the phase information of the diffracted light field, the phase shifting technology is used to introduce the reference light, and the light intensity information of the multi-frame interferogram is recorded respectively by performing multiple phase shifts on the reference light, so as to calculate the light intensity and the recorded plane object light wave. phase information. [0003] Traditional phase shifting methods include time phase shifting and spatial phase shifting. Time phase shifting methods include piezoele...

AI Technical Summary

Problems solved by technology

Although the spatial phase shift can be measured dynamically, due to the different spatial positions of the interferogram records, different detectors are required (if multiple detectors are used to receive different phase shift interferograms) or different parts of the detectors (if a single detector is used to receive different phase shifts). Partially receive different phase-shifted interferograms) with consistent photoelectric performance, and pixel-level position matching and grayscale correction are required between interferograms at different spatial positions, the process is cumbersome and involves a large amount of calculation

Therefore, the actual operation process is difficult and high-precision, and it is difficult to be practically applied.

In addition, both the traditional time phase shift method and the space phase shift method need to be carried out under high vibration isolation conditions.

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