Modal test device

A modal test and test bench technology, applied in the testing field, can solve the problems of poor consistency, poor repeatability, high cost, etc., and achieve the effect of convenient and fast test, high efficiency and good repeatability

Active Publication Date: 2016-06-29
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the traditional modal test device needs to manually locate the hammering position and hammering force, which has poor repeatability and consistency; and one positioning can only hammer one

Method used

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Embodiment Construction

[0021] The present invention will be further described in detail below. This embodiment is especially suitable for modal tests of microstructures. The self-contained test bench can solve the excitation problem of microstructures as a whole, such as the modal test of the automatic hammer excitation method of the traveling wave tube. However, the embodiments of the present invention are not limited thereto.

[0022] Such as Figures 1 to 2 As shown, the modal test device includes: a base, a translation mechanism installed on the base, and an excitation mechanism installed on the translation mechanism; wherein, the excitation mechanism includes an exciter, and a hammer handle 300 docked with the exciter, and the hammer handle 300 is provided with a hammer head 310, the hammer head 310 itself is a force-sensing element, or the hammer head 310 is provided with a force-sensing element, for example, the hammer head itself is an integrated force-sensing probe, and the force-sensing pr...

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Abstract

The invention relates to a modal test device. The modal test device comprises a base, a translation mechanism installed on the base, and an excitation mechanism installed on the translation mechanism, wherein the excitation mechanism comprises a vibration exciter and a hammer handle butted with the vibration exciter, the hammer handle is provided with a hammer head, and the hammer head itself is a force sensing element or the hammer head is provided with a force sensing element. The vibration exciter and an elastic reset member control the lifting and falling of the hammer handle so as to control the hammer head to knock a structure or the hammer head to leave the structure. In a plurality of tests, the excitation amplitude generated by the hammer head to the structure is certain, and the repeatability is good. The excitation mechanism is installed on the translation mechanism, the translation mechanism drives the excitation mechanism to move horizontally relative to the base, and the hammering test can be carried out on a plurality of points on the structure by one time of positioning, so that the test is convenient and rapid, and the efficiency is high.

Description

technical field [0001] The invention belongs to the testing field, and in particular relates to a modal test device. Background technique [0002] The modal test of the structure is to artificially vibrate the structure through a certain excitation method (such as single-point excitation or multi-point excitation; sinusoidal excitation force or random excitation force), and to extract the time domain or frequency of excitation input and structural response output. domain data; or under the actual operating conditions of the product or natural environment excitation, the response output data of the structure is extracted on site. The commonly used modal test is carried out by the hammering method. The hammer head is used to hammer the structure to be tested to generate an excitation force, and the parameter changes of the structure to be tested are collected under hammering, so as to obtain the dynamic characteristics of the structure to be tested. However, the traditional m...

Claims

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Application Information

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IPC IPC(8): G01M7/02
CPCG01M7/02
Inventor 宋芳芳何小琦恩云飞邱华荣
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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