A Method of Eliminating Dark Noise Drift of Array Spectrometer Using Optical Switch

Abstract

A method for adopting an optical switch to eliminate dark noise drift of an array spectrograph relates to a method for eliminating dark noise drift in the optical field. According to the method, the optical switch is disposed at an optical inlet of the array spectrograph, a light turn-on signal and a light turn-off signal are respectively recorded through switching the optical switch, a difference value between the light turn-on signal and the light turn-off signal is calculated and is taken as a real spectrum response, and then a dark noise drift system error is eliminated. The spectrograph linearity and a dynamic response scope can also be expanded, measurement steps are simplified, random noise intensity can be reduced, the fatigue degree of a photosensitive element can be reduced, and the method is easy to popularize and use.

Description

technical field [0001] The invention relates to a method for eliminating dark noise drift in the optical field, in particular to a method for eliminating dark noise drift of an array spectrometer by using an optical switch. Background technique [0002] The array spectrometer (that is, the array photosensitive spectrometer) adopts post-mounted spectroscopic analysis and uses CCD, CMOS or PDA array photosensitive elements to collect spectra. It has the advantages of small size, compact structure, and high signal collection efficiency. However, there is a dark current in the photosensitive element itself, and the dark current changes with temperature, and the temperature response of each pixel in the array is also different; this leads to the ubiquitous basic dark current error, dynamic overall temperature drift error and The systematic error between pixels. In actual measurement, it is difficult to distinguish the systematic error between pixels caused by temperature from th...

AI Technical Summary

Problems solved by technology

However, there is a dark current in the photosensitive element itself, and the dark current changes with temperature, and the temperature response of each pixel in the array is also different; this leads to the ubiquitous basic dark current error, dynamic overall temperature drift error and Systematic error between pixels

In actual measurement, the systematic error between pixels caused by temperature is difficult to distinguish from random error, and the overall error of the measurement result increases accordingly.

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