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Radiation effect testing device of CCD (Charge Coupled Device) detector

A radiation effect and test device technology, which is applied in the field of space electromagnetic environment radiation, can solve the problems of interference, the inability to accurately obtain the relationship between the performance parameters of the CCD detector and the radiation dose, and achieve the effect of reducing the impact

Active Publication Date: 2016-07-27
SHANGHAI XINYUE METER FACTORY
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0004] The problem to be solved by the present invention is that in the ground irradiation test of the CCD detector, because the processor circuit is disturbed by the radiation source, it is impossible to accurately obtain the relationship between the performance parameters of the CCD detector and the radiation dose; in order to solve the problem , the invention provides a CCD detector radiation effect test device and method

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  • Radiation effect testing device of CCD (Charge Coupled Device) detector

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Embodiment Construction

[0013] like figure 1 As shown, it is a schematic diagram of the present invention, which is mainly composed of a secondary power supply module, a digital processing module, a driving module, a video signal processing module and a CCD module. according to figure 1 In the schematic diagram shown, the hardware circuit of the test device is designed as two printed boards, which are the photoelectric detection board and the data processing board.

[0014] 1. Photoelectric detection board design

[0015] The photoelectric detection board includes a detector circuit, a drive circuit and an image acquisition circuit.

[0016] 1) Detector circuit

[0017] The detector circuit uses resistors and capacitors to set reasonable bias and decoupling, uses emitter follower to isolate the output end of CCD detector from the subsequent stage circuit, and outputs the analog video signal of the detector;

[0018] 2) Drive circuit

[0019] The drive circuit converts the TTL timing signal gener...

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Abstract

The invention discloses a radiation effect testing device of a CCD (Charge Coupled Device) detector. The radiation effect testing device comprises a photoelectric detection board and a data processing board, wherein the photoelectric detection board is composed of three parts including a detector circuit, a driving circuit and an image acquisition circuit; and the data processing board is composed of two parts including a power supply circuit and a processor circuit. By virtue of the radiation effect testing device, the problems that a data processing circuit is influenced by a radiation source in a radiation effect simulation test of the CCD detector so that a principle that photoelectric parameters of the CCD detector are changed along a radiation dosage cannot be really measured are solved; and meanwhile, the six CCD detectors can be subjected to the radiation simulation test at the same time, and the measurement of a principle that property parameters of the CCD detector under different working states are changed along the radiation dosage can be realized for one time.

Description

technical field [0001] The invention relates to the field of space electromagnetic environment radiation, and more particularly relates to a test device and method for testing the anti-space radiation effect capability of a CCD detector used in a spacecraft star sensor. Background technique [0002] As an important means of spacecraft attitude determination, high-precision star sensors have the advantages of high precision, good stability, and no error accumulation over time, so they are widely used in large satellites, space stations, and new spacecraft. Attitude determined core stand-alone. According to the function, the star sensor can be divided into optical unit, imaging unit, data processing unit and data exchange unit. The imaging unit is the core part of the star sensor, which is mainly responsible for detecting photons of stars, and shooting star images with high signal-to-noise ratio for the data processing unit to identify and match star maps. The detector chips...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C25/00
Inventor 王有峰闫晓军韩飞侯建文梁彦贺亮
Owner SHANGHAI XINYUE METER FACTORY