A high-speed signal isolation device

Abstract

The invention discloses a high-speed signal isolation device. The high-speed signal isolation device comprises a chip output device, an integrated load and a test machine; the test machine includes a test transmission line and a voltage probe resistor; the test transmission line is a test transmission line from the output end from the chip output device to one end of the voltage probe resistor; the integrated load includes a load capacitor and an isolation / load resistor; the isolation / load resistor is connected between the output end of the chip output device and the test transmission line; and one end of the load capacitor is connected between the output end of the chip output device and the isolation / load resistor. With the high-speed signal isolation device of the invention adopted, the problem of an abnormal high current phenomenon caused by the test machine can be effectively solved, so that a bulging phenomenon can be alleviated.

Description

technical field [0001] The present application relates to the field of electronic technology, in particular to a high-speed signal isolation device. Background technique [0002] With the rapid development of integrated circuits, the manufacturing process continues to improve, and the feature size of the process continues to decrease. Digital, analog, and radio frequency circuit modules can be integrated into the same chip, and the performance is becoming more and more powerful. There is no doubt that this will give test Work brings higher demands. [0003] In order to detect AC parameters such as transmission delay and leakage current of each pin of the integrated circuit, the existing test scheme usually uses the 93000SOC (System-on-a-Chip) test system, or a dedicated test system running on the Linux operating platform of the HP PC workstation. Software to complete the detection of integrated circuits. [0004] In a traditional test setup, it includes chip output termina...

AI Technical Summary

Problems solved by technology

[0006] The invention provides a high-speed signal isolation device to solve the problem that when multiple output ports of a circuit such as a multi-stage trigger are opened simultaneously, the instantaneous abnormally large current phenomenon caused by the tester causes the output of the port to bulge and affects the circuit test result.

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