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A Calibration Method for S-parameter Amplitude-Frequency Characteristics of Modular Probes

A technology of amplitude-frequency characteristics and calibration method, which is applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of inability to calibrate the modular probe, and achieve the effect of simple and accurate modeling and simple calibration methods

Active Publication Date: 2019-04-12
BEIHANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to overcome the problem that existing calibration methods cannot calibrate modular probes with multi-array pin connectors at one end, and propose a calibration method for the S-parameter amplitude-frequency characteristics of modular probes , it is only necessary to make a calibration backplane as a calibration part, and the calibration method is simple; in addition, since the connector sockets on the calibration backplane are set to a single row, the calibration backplane with only a single row of pin connector sockets is used to pair the connector sockets with multiple rows of pins The acquisition module of the connector plug is tested column by column, and each pin of the modular probe can be calibrated. At the same time, the modeling of the calibration backplane is simple and accurate, so that more accurate calibration results of the S-parameter amplitude-frequency characteristics can be obtained.

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  • A Calibration Method for S-parameter Amplitude-Frequency Characteristics of Modular Probes
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  • A Calibration Method for S-parameter Amplitude-Frequency Characteristics of Modular Probes

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Embodiment Construction

[0028] The present invention will be further described in detail below with reference to the drawings and embodiments.

[0029] Such as figure 1 As shown, the present invention proposes a calibration method for the S-parameter amplitude-frequency characteristics of a modular probe, which includes the following processing steps:

[0030] Step 1. Calibrate backplane production. The structure of the calibration backplane is as attached figure 2 As shown in (a), it consists of two single-row integrated RF rack connector sockets and interconnecting lines between the same pins. The size of the single-row pin is the same as that of the multi-row pin connector, and only the number of pin rows is one row , A series of ground holes are punched at the boundary of the calibration backplane to connect the ground networks of different layers. The pins of the connector plug on the modular probe are multi-row, and each row of pins has a signal lead. Use a single row of pin connector after remov...

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Abstract

The invention relates to a calibration method capable of aiming at the S parameter amplitude-frequency characteristic of a modularized probe. A transmission signal acquisition module with a modularized probe structure is inserted into a calibration backboard of a known characteristic parameter for testing, a connector on the calibration backboard is designed into single-row pins, a row-by-row test is carried out, and the S parameter amplitude-frequency characteristic from each connector pin to the radio frequency interface of the other end of the modularized probe is induced by cascade characteristics according to a test result. The calibration method can aim at the modularized probe of which one end is a multi-array pin connector for calibration and has a simple calibration way, meanwhile, the calibration backboard is designed to make modeling simple and accurate, and an accurate S parameter amplitude-frequency characteristic calibration result can be obtained.

Description

Technical field [0001] The invention belongs to the field of signal testing and relates to a calibration method for the S parameter amplitude-frequency characteristics of a modular probe. Background technique [0002] Modular probe is a kind of conduction signal acquisition module for modular integrated radio frequency rack. It can use the radio frequency interface to collect the conduction signal of multiple pins on the corresponding slot on the backplane of integrated radio frequency rack through electronic switch array control. It is a connector with multiple rows of pins that can be inserted into an integrated radio frequency rack, and the other end is a radio frequency interface that can be connected to test equipment such as a spectrum analyzer. As a signal acquisition device, the modular probe needs to calibrate its S-parameter amplitude-frequency characteristics. [0003] Usually, the S-parameter calibration method for the test device is the SOLT calibration method. For si...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50
CPCG06F30/367
Inventor 戴飞王顺鑫高占威郑涛李惟苏东林
Owner BEIHANG UNIV