Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A testing device for improving the testing efficiency of amorphous

A technology of testing efficiency and testing equipment, which is applied in semiconductor/solid-state device testing/measurement, electrical components, semiconductor/solid-state device manufacturing, etc., can solve problems such as unfavorable handling and placement, high cost, and low testing efficiency, and achieve improvement Test efficiency, reduce operating actions, and increase the effect of continuity

Active Publication Date: 2018-08-03
SHENZHEN SUNWAY COMM
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This test method is not conducive to picking and placing, and has the problems of low test efficiency and high cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A testing device for improving the testing efficiency of amorphous
  • A testing device for improving the testing efficiency of amorphous
  • A testing device for improving the testing efficiency of amorphous

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0022] In view of the traditional technology, the single-chip amorphous material test is mainly carried out by manual pick-and-place, which cannot be tested continuously, and there are problems of low test efficiency and high cost. The invention proposes an improved scheme, which realizes the continuous test of a single piece of amorphous material by using the rotation of the transmission roller and the guide column, greatly improves the test efficiency and reduces the test cost.

[0023] see Figure 2 to Figure 5 As shown, the test device provided by the present invention mainly includes an oscil...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a testing device for improving the amorphous testing efficiency. According to the invention, a baffle plate is additionally arranged on an original test fixture, a material belt is driven to move forward by using rotation of a plurality of driving rollers and guide posts which are arranged on the baffle plate, and a magnet is utilized to adsorb and fix a single amorphous piece to be tested when the material belt moves to a test area of the test fixture, thereby accomplishing continuous testing for the single amorphous pieces to be tested. Compared with the prior art, the testing device provided by the invention increases the continuity of a production test, improves the test efficiency, reduces operation actions, and improves the assembling efficiency.

Description

technical field [0001] The invention belongs to a test device, in particular to a test device for improving the testing efficiency of amorphous. Background technique [0002] Amorphous alloy is a new type of alloy material. It adopts advanced ultra-quick cooling and rapid quenching technology to form a solid thin strip with a thickness of 0.02-0.04mm at a cooling rate of 1×106°C / s to obtain atomic arrangement and combination. The amorphous structure features short-range order and long-range disorder, and does not have the crystal structure of traditional alloy materials. Due to the properties of high saturation magnetic induction, low coercive force, and low loss, amorphous alloys have a wide range of applications in the field of wireless charging. [0003] The current wireless charging technology is limited by the problem of wire materials, resulting in low charging efficiency, but the emergence of amorphous strips can greatly improve the efficiency of wireless charging. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66H01L21/67
CPCH01L21/67242H01L22/10H01L22/30
Inventor 景丽欢谷媛徐雨胡星星
Owner SHENZHEN SUNWAY COMM
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com