Emulator and method supporting coverage rate statistics function
A coverage and emulator technology, applied in functional inspection, instrumentation, computing, etc., can solve the problems of long development cycle, unsuitable for application development and testing, and high cost of emulator, and achieve the effect of easy implementation
Active Publication Date: 2016-11-02
BEIJING CEC HUADA ELECTRONIC DESIGN CO LTD
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Problems solved by technology
This method can record all trajectories of the program, which is very helpful for problem analysis and positioning, but it has relatively high requirements for emulator hardware memory capacity, memory read and write speed, and data transmission speed. The key data compression design is more complicated, and the analysis and comparison of big data Difficult, the cost of the emulator to realize the TRACE function is high, the development cycle is long, and it is not suitable for the development and testing of a large number of application programs
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[0029] The emulator of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0030] Such as figure 1 As shown, the emulator includes a debugging control module 1, a chip function module 2 and a coverage statistics module 3, the chip function module 2 includes CPU_DBG4, AHB bus, chip program memory 5, peripherals 6, and the coverage statistics module 3 includes a statistics module 7 , a register 8, an interface conversion module 9, a selection module 10, and a statistical data memory 11.
[0031] The debugging control module 1 is connected to the CPU_DBG4, and the CPU_DBG4 accesses the chip program memory 5 and the peripherals 6 through the AHB bus. CPU_DBG4 downloads the program to the chip program memory 5 under the control of the debugging control module 1, and performs operations such as single step, stop, and run. The interface conversion module 9 is connected to the AHB bus, and the interface conversion module 9 is conn...
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The invention discloses an emulator and method supporting coverage rate statistics function, and relates to the technical field of chip simulation. The emulator comprises a debugging control module, a chip function module and a coverage rate statistics module, wherein the chip function module comprises CPU_DBG, an AHB bus, a chip program memory and peripheral equipment, the coverage rate statistics module comprises a statistics module, a register, an interface switching module, a selection module and a statistics data memory, and the statistics module uses the signals of the CPU_DBG and the AHB bus to record program execution address information on the statistics data memory on a real-time basis. The coverage rate statistics method includes the steps of setting an initial statistics address after entering into a debugging mode, starting the statistics function, initializing the statistics data memory, entering into an operation mode executive program, and exporting statistics data after a test is completed and calculating the test coverage rate. The emulator supports the functions of code coverage rate, branch coverage rate and data coverage rate statistics, test program and tested program problems can be rapidly positioned, and program developing test efficiency is improved.
Description
technical field [0001] The invention relates to a chip emulator, in particular to an emulator and method supporting the coverage statistics function. Background technique [0002] In the program development and testing of smart card chips, whether the test is comprehensive (that is, the test coverage) has always been a problem that developers and testers are more concerned about. To realize the test coverage statistics function in the chip emulator, there are currently two commonly used implementation methods: the program insertion method and the emulator TRACE function. [0003] The program insertion method refers to the analysis of the designed program or the compiled program code instructions through the software, inserting the functional program at a special position, the program outputs the execution information during the test operation, and then obtains the result through software analysis. Test coverage. This method is more complicated to insert program code design...
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IPC IPC(8): G06F11/26G06F11/36
CPCG06F11/261G06F11/3676
Inventor 张洪波
Owner BEIJING CEC HUADA ELECTRONIC DESIGN CO LTD