A Position Correction Method for Fourier Stack Microscopic Imaging Technology

Abstract

The invention discloses a position correction method for Fourier stacked microscopic imaging technology. First, a set of low-resolution images are taken, the high-resolution spectrum of the object is initialized, and the number of iterations j=1 is initialized; the jth time is calculated Iterative update range Sj; all images within the update range Sj are updated, and the simulated annealing method is used to correct the spectral aperture position corresponding to each image before updating; after the jth iteration is completed, the nonlinear regression method is used to update the position of the LED array Parameters, re-initialize the high-resolution spectrum of the object; j=j+1, if the update range Sj does not include all images, return to the iteration step. When the update range Sj includes all images, perform the next step; continue iterating for at least 3 times, no spectrum initialization is performed after each iteration, and the high-resolution light intensity and phase map of the object is finally obtained. The invention avoids the influence of the LED array positioning error on the reconstruction result and improves the image quality reconstructed by the Fourier stack microscopic imaging technology.

Description

Technical field [0001] The invention belongs to the field of system correction of microscopic imaging technology, and particularly relates to a position correction method for Fourier stacked microscopic imaging technology. Background technique [0002] In the field of microscopic imaging, higher resolution has always been the goal, but there is a key problem while increasing the resolution, that is, the spatial bandwidth product of the microscope does not increase with the resolution, in other words, the traditional microscope There is a contradiction that resolution and field of view cannot be considered at the same time. This is because the traditional microscope uses a low-power objective lens for imaging with a large field of view but low resolution, while using a high-power objective lens for imaging increases the resolution but the corresponding field of view is reduced. At present, in order to break through the contradiction between resolution and field of view size, the ...

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Problems solved by technology

[0004] Fourier stack microscopic imaging technology is a new type of large field of view high-resolution microscopic imaging technology, but its reconstruction quality is often affected by the positioning error of the LED array, especially when adjusting the Fourier stack microscopic imaging technology. It is difficult to locate the spatial position of the LED unit very accurately in the optical path of the imaging system. Therefore, how to effectively correct the positioning error of the LED array so that it does not affect the final reconstruction quality has become a problem that must be overcome by the Fourier stack microscopic imaging technology. a technical problem of

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