Method for identifying multi-element characteristic spectrum peaks in energy dispersion X-ray fluorescence spectrum

Abstract

The invention discloses a method for identifying multi-element characteristic spectrum peaks in an energy dispersion X-ray fluorescence spectrum. The method comprises the following steps: carrying out independent component analysis on an XRF two-dimensional spectrum measured from an actual sample, utilizing an obtained preliminary analysis result as an initial solution of non-negative matrix factorization, carrying out precise solving by virtue of iteration correction of the non-negative matrix factorization, carrying out contrastive analysis on a differential spectrum of a solved single-element calculation spectrum and a differential spectrum of a standard spectrum, and determining the similarity of the two differential spectrums by virtue of Pearson's correlation coefficient, so as to accurately identify element characteristic spectrum peaks; and obtaining the concentration values of corresponding elements according to the solved single-element calculation spectrum and an established standard curve, and realizing quantitative analysis. The method can be effectively applied to the effective identification of the multi-element characteristic spectrum peaks in the energy dispersion XRF spectrum and the quantitative detection of the elements.

Description

technical field [0001] The invention relates to the technical field of X-ray fluorescence spectrum detection, in particular to a method for identifying multi-element characteristic spectrum peaks in energy dispersive X-ray fluorescence spectrum. Background technique [0002] As a kind of atomic emission spectroscopy, X-ray fluorescence (X-ray Fluorescence, referred to as XRF) spectroscopy has the characteristics of simple sample pretreatment, non-destructive, fast analysis speed, and simultaneous measurement of multiple elements. It has become an effective means for rapid, non-destructive and on-site detection of heavy metals. XRF spectroscopy is to excite the sample to be tested by generating high-energy X-rays to generate characteristic secondary X-rays (also called X-ray fluorescence), and to characterize the sample to be tested according to the wavelength or energy and fluorescence intensity of the characteristic X-ray fluorescence. and quantitative analysis. At presen...

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Problems solved by technology

[0007] In this way, in the actual sample detection, because the types of elements contained in the sample are unknown, when multiple elements exist at the same time, the peaks in the measured energy dispersive XRF spectrum may be the overlapping peaks of the above-mentioned elements with similar peak energy. Therefore, the above-mentioned The method of identifying and judging spectral peaks by setting the maximum energy deviation threshold comparison, according to the application publication number CN105548230A patent, setting the maximum deviation threshold as 50eV, cannot accurately judge and identify the spectral peaks in the measured XRF spectrum, let alone accurately explain the two spectra Simultaneous presence of peaks

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