Method and device for processing vulnerability risk of automated information system

A technology of an information system and a processing method, which is applied in the field of processing methods and devices for the vulnerability risk of an automated information system, can solve problems such as the inability to effectively evaluate the risk vulnerabilities of a machine computer, and the difficulty of troubleshooting machine computer failures, so as to improve the efficiency of investigation and improve Diversity and accuracy, the effect of avoiding troubleshooting errors

Active Publication Date: 2019-12-03
SEMICON MFG INT (SHANGHAI) CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present invention provides a method and device for processing the vulnerability risk of an automated information system, so as to at least solve the technical problem in the prior art that it is difficult to troubleshoot the machine computer after it fails due to the inability to effectively evaluate the risk loopholes of the machine computer

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  • Method and device for processing vulnerability risk of automated information system
  • Method and device for processing vulnerability risk of automated information system
  • Method and device for processing vulnerability risk of automated information system

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Embodiment Construction

[0032] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0033]It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate c...

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Abstract

The invention discloses a processing method and device of vulnerability risks of an automatic information system. The method includes the steps of issuing detecting scripts to all terminals in the information system; obtaining vulnerability risk information of all the terminals, wherein all the terminals execute the detecting scripts to obtain the risk information, and the vulnerability risk information is used for depicting one or more vulnerability risk factors of all the terminals; determining whether network risks exist in the terminals on the basis of the vulnerability risk factors; if yes, obtaining the risk levels of the terminals; generating the prompting information of the risk levels of the terminals. The technical problem that in the prior art, the risk vulnerability of a desktop computer can not be effectively evaluated, so troubleshooting is difficult after the desktop computer fails is solved, and the effect of improving the failure troubleshooting efficiency of the desktop computer is achieved.

Description

technical field [0001] The invention relates to the field of system automation, in particular to a method and device for processing vulnerability risks of automated information systems. Background technique [0002] The Equipment Automation Process (EAP for short) is an indispensable process in the process quality management of fabs above 8 inches. When each batch of wafers is produced, it will be confirmed by EAP before and after production, and the wafers will be controlled. The process formula and the operation of the control machine, but if an abnormal situation is found, the production of this batch of wafers will be stopped to prevent erroneous operations and the scrapping of the entire batch of wafers. In the part of the measurement machine, the data related to wafer measurement will also be collected, and will be reported to the Manufacturing Execution System (MES) for data analysis after the process is completed. The machine computer is the key basis for running au...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F21/57
CPCG06F21/577G06F2221/034
Inventor 司卫莉齐济费永清伍鹏
Owner SEMICON MFG INT (SHANGHAI) CORP
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