Unlock instant, AI-driven research and patent intelligence for your innovation.

LTE TDD RRU peak-to-average ratio statistical method based on FPGA

A statistical method and peak-to-average ratio technology, applied to the field of communication, can solve the problems of system performance degradation, in-band signal distortion, and VBW not having such high precision, and achieve the effect of high efficiency, simple, convenient and flexible operation, and fast speed.

Active Publication Date: 2016-12-14
WUHAN POST & TELECOMM RES INST CO LTD
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The PAR at the probability of 0.01% is generally called the peak factor. Since the dynamic range of the general power amplifier is limited, the signal with a relatively large peak-to-average ratio can easily enter the nonlinear region of the power amplifier, resulting in a nonlinear signal. Distortion, causing obvious spectrum spread interference and in-band signal distortion, resulting in the degradation of the overall system performance
[0004] The traditional method of measuring the peak-to-average ratio is to lead a test point at the entrance of the power amplifier or the exit of the small signal, and use a spectrum analyzer to measure the peak-to-average ratio of the modulated signal at a probability of 0.01%. This method has the following limitations: first , you need to use a spectrum analyzer to get the test results; second, for broadband signals above 20M, etc., the spectrum analyzer needs a high VBW to accurately give the PAR value, and the VBW of many spectrum analyzers does not have such a high accuracy
[0010] 6. DPD (Digital Pre-Distortion) digital pre-distortion

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • LTE TDD RRU peak-to-average ratio statistical method based on FPGA
  • LTE TDD RRU peak-to-average ratio statistical method based on FPGA
  • LTE TDD RRU peak-to-average ratio statistical method based on FPGA

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0047] The technical solution of the present invention will be described in detail below in conjunction with the drawings and embodiments.

[0048] The peak-to-average ratio calculated by the present invention is after the crest factor reduces the CFR, and the data after the CFR enters the power amplifier module through the digital pre-distortion DPD, and the analog and radio frequency small signal links; the DPD will not affect the peak-to-average ratio, and the analog and RF small-signal links all work in the linear region, and local oscillator frequency shifting will not affect the peak-to-average ratio, so it can be considered that the peak-to-average ratio after CFR is equal to the peak-to-average ratio of the power amplifier inlet or small signal output.

[0049] The length of a TDD signal frame is 10ms, which is composed of multiple time slots. See Table 1 and Table 2. The technical solution of the present invention is a method for detecting the peak-to-average ratio of ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an LTE TDD RRU peak-to-average ratio statistical method based on a FPGA. In a remote radio unit, a CPU configures TDD time slot information and the FPGA detects a frame header signal; the maximum PAR value PAR_max of the current TDD frame signal is detected, including statistics of the maximum power C of 10000 data before the current moment and the sum D of power of 10000 data before the current moment, and the PAR value of each moment in the current TDD frame signal is detected one by one; and the CPU takes out the PAR_max value out of the FPGA and converts the PAR_max value so as to obtain the peak-to-average ratio of the current TDD frame signal. With application of the technical scheme, the PAR value before arrangement of a power amplifier or the PAR value outputted by small signals can be simultaneously calculated without a frequency spectrograph or limitation of bandwidth so that operation is simple, convenient and flexible; and statistics of the peak-to-average ratio is realized by using the FPGA logic so that speed is high and efficiency is high.

Description

technical field [0001] The present invention relates to the technical field of communication, in particular, relates to a peak-to-average ratio detection method of an LTE TDD RRU transmission link. Background technique [0002] LTE is the long-term evolution of 3G, which is currently called 4G. In LTE, the multi-carrier multiple access method OFDMA is mainly used for the downlink. The main advantages of this are: strong anti-multipath fading ability; high spectrum efficiency; reception The machine design is mature and reliable. However, since OFDMA adopts multi-carrier technology, the peak-to-average ratio is relatively high, so the DPD performance and the linearity requirements of the power amplifier are relatively high. Therefore, the peak-to-average ratio PAR is a very critical and important indicator in the system design of LTE RRU, and it directly affects the power amplifier. The determination of the 1db compression point of the module, the ACPR value, the efficiency o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L27/26H04B17/10H04B17/26
CPCH04B17/101H04B17/26H04L27/2614
Inventor 李昌元赵雨徐鹏周博海王艳欢周世军杨浩
Owner WUHAN POST & TELECOMM RES INST CO LTD