X-ray inspection apparatus and operation method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HITACHI LTD
- Publication Date
- 2016-12-28
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention relates to a photography technique of an X-ray inspection device, in particular to a tomosynthesis photography technique. Background technique
[0002] As a method of non-destructively visualizing the inside of a subject for medical diagnosis and defect inspection of industrial products, there is an X-ray inspection method in which a subject is irradiated with X-rays and the transmitted X-rays are detected. In addition, there is an X-ray CT (Computed Tomography: computerized tomography) inspection method in which, in order to three-dimensionally understand the inside of a subject, the subject is irradiated with X-rays while rotating and the transmitted X-rays are detected. A reconstruction calculation process is performed to obtain a cross-sectional image. Among the CT examination methods, there are fan-beam CT imaging, cone-beam CT imaging, tomosynthesis using transmitted X-ray information at a limited rotation angle, and tomographic X-...