Thin film transistor characteristic detection device and display device
A technology of thin-film transistors and detection devices, which is applied in the direction of measuring devices, single semiconductor device testing, and electrical measurement, and can solve the problems of inability to simulate the remote TFT of the display panel, inability to detect and test the turn-on current of the thin-film transistor, and the turn-on delay time of the turned-off current To achieve the effect of improving the ability of quality monitoring, reducing the width of traces, and reducing the waste of materials
Inactive Publication Date: 2018-11-23
BOE TECH GRP CO LTD +1
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Problems solved by technology
[0004] The main purpose of the present invention is to provide a characteristic detection device and display device of a thin film transistor, which solves the problem that in the prior art, it is impossible to simulate the characteristics of the remote TFT (thin film transistor) of the display panel to achieve the purpose of monitoring products, and it is impossible to detect and test Thin film transistor turn-on current, turn-off current and / or turn-on delay time issues
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[0050]The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0051] Such as figure 1 As shown, the device for detecting the characteristics of the thin film transistor according to the embodiment of the present invention is used to detect the characteristics of the test thin film transistor Ttest included in the display panel, including the gate test terminal GTE, the source test terminal STE and the drain test terminal DTE ; The gate test terminal GTE is electrically connected to the gate of the test thin film transisto...
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The invention provides a thin-film transistor characteristic detection device and display equipment. The thin-film transistor characteristic detection device comprises a grid electrode testing end, a source electrode testing end and a drain electrode testing end as well as a characteristic detection unit, wherein the source electrode testing end is connected to a working voltage output end; and the characteristic detection unit is respectively connected to the grid electrode testing end and the drain electrode testing end and is used for correspondingly detecting electric signals output by the drain electrode testing end by respectively inputting different control signals to the grid testing end so as to detect the firing currents, turn-off currents and / or turn-on delay time of a tested thin-film transistor. The thin-film transistor characteristic detection device solves the problems in the prior art that the characteristics of the thin-film transistor at the far end of a display panel cannot be simulated to achieve the purpose of monitoring products, and the firing currents, turn-off currents and / or turn-on delay time of the tested thin-film transistor cannot be detected.
Description
technical field [0001] The invention relates to the technical field of characteristic detection of thin film transistors, in particular to a characteristic detection device and display device of thin film transistors. Background technique [0002] The driver of TFT-LCD (Thin Film Transistor-Liquid Crystal display, Thin Film Transistor-Liquid Crystal display) mainly includes a gate driver and a data driver, wherein the gate driver converts the input clock signal through a shift register and then adds it to the LCD panel on the grid. [0003] The existing ET (electronic test, electrical test) pad (port) design for TFT-LCD is only used in the product testing stage, and is not used in the mass production stage of the production line, and the existing electrical characteristic test device has not passed the reduction of wiring Width and increase the wiring distance to simulate the characteristics of the remote TFT (thin film transistor) of the panel (display panel) to achieve th...
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IPC IPC(8): G01R31/26G02F1/1362
CPCG01R31/2621G02F1/1362G02F1/136254
Inventor 徐飞薛伟
Owner BOE TECH GRP CO LTD