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Phase comparator and gated vernier type time-to-digital conversion circuit

A phase comparator and gating technology, applied in the electrical field, can solve the problems of occupying a large area, time-limited digital conversion circuit measurement accuracy and application range, etc.

Active Publication Date: 2019-03-22
SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The traditional phase comparator uses many gate circuits, which will occupy a large area for a large phase comparator array, and there will be nearly 8 gate delays between the rising edge of the input signal and the output signal, which is extremely problematic. Greatly limit the measurement accuracy and application range of traditional time-to-digital conversion circuits, operating frequency, etc.

Method used

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  • Phase comparator and gated vernier type time-to-digital conversion circuit
  • Phase comparator and gated vernier type time-to-digital conversion circuit
  • Phase comparator and gated vernier type time-to-digital conversion circuit

Examples

Experimental program
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Effect test

Embodiment 1

[0085] see image 3 , the present invention provides a phase comparator 1, the phase comparator 1 includes: a first phase detection unit 11, the first phase detection unit 11 includes a first input terminal, a second input terminal, a third input terminal and output terminal; the first input terminal of the first phase detection unit 11 is connected to the first signal to be detected Si, the second input terminal of the first phase detection unit 11 is connected to the first reset signal Rp, and the The third input terminal of the first phase detection unit 11 is connected to the power supply voltage VDD; the first phase detection unit 11 is adapted to detect the rising edge of the first signal to be detected Si; the second phase detection unit 12, the The second phase detection unit 12 includes a first input terminal, a second input terminal, a third input terminal and an output terminal; the first input terminal of the second phase detection unit 12 is connected with the sec...

Embodiment 2

[0098] see Figure 5 , the present invention also provides a vernier type gated ring oscillator, the vernier type gated ring oscillator includes: a fast gated ring oscillator 2, the fast gated ring oscillator 2 includes a first input terminal, a second Two input terminals and a plurality of output terminals; the first input terminal of the fast-gated ring oscillator 2 is connected to the first input signal CLK_S, and the second input terminal of the fast-gated ring oscillator 2 is connected to the first control voltage The signals VF_S are connected; the fast gated ring oscillator 2 is suitable for quantizing the first input signal CLK_F to generate CLK_F[0], CLK_F[1]...CLK_F[n-1], CLK_F[n ] a total of n+1 second signals to be detected; it should be noted that the second signal to be detected here is the same signal as the second signal to be detected Fi described in Embodiment 1; slow gating A ring oscillator 3, the slow gated ring oscillator 3 includes a first input end, a ...

Embodiment 3

[0103] The present invention also provides a gated vernier type time-to-digital conversion circuit, and the gated vernier type time-to-digital conversion circuit includes the vernier type gated ring oscillator described in the second embodiment. For the specific structure of the vernier-type gated ring oscillator, please refer to

[0104] Embodiment 2 will not be repeated here.

[0105] In summary, the present invention provides a phase comparator and a gated vernier type time-to-digital conversion circuit, the phase comparator includes: a first phase detection unit, including a first input terminal, a second input terminal, a third input terminal terminal and output terminal; the first input terminal of the first phase detection unit is connected with the first signal to be detected, the second input terminal of the first phase detection unit is connected with the first reset signal, and the first The third input end of the phase detection unit is connected to the power supp...

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Abstract

The invention provides a phase comparator and a gating cursor type time-digital conversion circuit. The phase comparator comprises a first phase detection unit, a second phase detection unit, a first switching tube, a second switching tube and a comparison module. The phase comparator has small size, and does not occupy the area of the gating cursor type time-digital conversion circuit; meanwhile, only about four gate delays are required between an input signal and an output signal through the phase comparator, and measurement accuracy is high, thus expanding the use range of the phase comparator and improve the working efficiency of the phase comparator.

Description

technical field [0001] The invention belongs to the field of electrical technology, in particular to a phase comparator and a gate-controlled vernier type time-to-digital conversion circuit. Background technique [0002] The vernier type time-to-digital conversion circuit converts tiny continuous time intervals into precise digital output. Generally, the measurable range is on the order of hundreds of picoseconds, and its resolution can reach several picoseconds. Vernier-type time-to-digital conversion circuits are widely used in scientific research and engineering technology, such as particle life cycle measurement in high-energy physics, laser detection distance, medical biological imaging, time-of-flight (TOF) measurement, etc. Further research on the vernier-type time-to-digital conversion circuit is conducive to continuously improving the performance and application of the time-to-digital conversion circuit. [0003] The overall structural block diagram of the traditio...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G04F10/00
CPCG04F10/005
Inventor 汪辉黄景林章琦汪宁田犁叶汇贤黄尊恺
Owner SHANGHAI ADVANCED RES INST CHINESE ACADEMY OF SCI