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Method and device for estimating the weight of inspected objects in security inspection system

An object and weight technology, applied in the field of security inspection, can solve problems such as complex and bulky systems

Active Publication Date: 2018-09-21
TSINGHUA UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

This makes the whole system complex and bulky

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  • Method and device for estimating the weight of inspected objects in security inspection system
  • Method and device for estimating the weight of inspected objects in security inspection system
  • Method and device for estimating the weight of inspected objects in security inspection system

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Embodiment Construction

[0024] Specific embodiments of the present invention will be described in detail below, and it should be noted that the embodiments described here are only for illustration, not for limiting the present invention. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. It will be apparent, however, to one of ordinary skill in the art that these specific details need not be employed to practice the present invention. In other instances, well-known structures, materials or methods have not been described in detail in order to avoid obscuring the present invention.

[0025] In the principle of radiation imaging, the most basic formula is I=I 0 exp(-μt), that is, the monoenergetic ray beam intensity decays exponentially with the thickness of the absorbing material, where I 0 is the total number of photons before being attenuated, I is the number of photons after attenuation, t is the mass thickn...

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Abstract

A method and device for estimating the weight of an object to be inspected in a security inspection system are disclosed. Through dual-energy ray scanning, the equivalent atomic number value and dual-energy high-energy grayscale characteristic value corresponding to each pixel of the inspected object are obtained. The mass thickness value of the corresponding pixel is obtained from the pre-created mass thickness attenuation curve using the equivalent atomic number of each pixel and the dual-energy high-energy grayscale characteristic value. Weight information of at least a portion of the inspected object is obtained by multiplying the mass thickness value by the area of ​​the pixel. This method can more accurately calculate the weight of the object being inspected, saving the cost of traditional weighing hardware.

Description

technical field [0001] The present application relates to security inspection, in particular to a method and device for calculating the weight of an inspected object based on radiographic imaging. Background technique [0002] Security inspection is of great significance in the fields of anti-terrorism and combating drug trafficking and smuggling. After 911 in the United States, public places such as aviation and railways paid more and more attention to safety inspections. With the deepening of the crackdown on drug trafficking and smuggling, the inspection requirements for customs containers, luggage and other items are also getting higher and higher. [0003] The current security inspection system is dominated by radiation imaging systems, of which dual-energy ray imaging systems are the most widely used. The equivalent atomic number information that this system can obtain, that is, the material properties are undoubtedly a major feature of the inspected object , which c...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01V5/00
CPCG01N23/04G01N23/087G01V5/224G01N23/046G01N23/083G01V5/12G01V5/22G01V5/226
Inventor 陈志强李元景张丽赵自然刘耀红郑娟顾建平宗春光
Owner TSINGHUA UNIV