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Photoelectric system for yarn defect detection

A technology of optoelectronic system and detection system, which is applied in measurement devices, optical testing of flaws/defects, material analysis by optical means, etc., can solve the problems of high detection cost, yarn interference, complex structure, etc., and achieve a large detection field of view. , the effect of solving false detection and simple system structure

Inactive Publication Date: 2019-03-26
XIAN TECH UNIV
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to provide a photoelectric system for yarn defect detection, which solves the problems of complex circuit structure, high detection cost, and interference and error caused by yarn vibration during high-speed motion in the prior art. Inspection and other technical issues

Method used

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Embodiment Construction

[0015] Below in conjunction with accompanying drawing, the present invention is further described, with reference to figure 1 and figure 2 Shown is a photoelectric system for yarn defect detection, which is set on both sides of the tested yarn 1, including a background light source system set on one side of the tested yarn 1 and a background light system set on the other side of the yarn Defect detection system; the background light source system and the defect detection system are on the same level; the background light source system includes a background light source screen 2 and a light source controller 3 connected with the background light source screen 2, the brightness and color of the background light source screen 2 It can be adjusted so that the yarn under test 1 falls into the background light source to highlight the defects on the yarn under test 1; the defect detection system includes an optical system 4 adjacent to the yarn under test, along which the optical sy...

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Abstract

The invention relates to a photoelectric system for detecting yarn faults. The system is arranged at two sides of to-be-detected yarns, and comprises a background light source system arranged at one side of the to-be-detected yarns and a fault detection system arranged at the other side of the yarns; the background light source system comprises a background light source screen and a light source controller connected with the background light source screen; the fault detection system comprises an optical system perpendicular to the to-be-detected yarns; a detection slit and a photoelectric detector are sequentially arranged along the optical axis direction of the optical system; the background light source screen, the optical system and the detection slit form a sector detection visual field containing the to-be-detected yarns. The photoelectric system disclosed by the invention has the advantages of wide detection visual field, simple system structure and low manufacturing and using cost; according to the system, the background light source, the optical system and the slit are adopted to form the sector detection visual field with uniform thickness, the yarns are enabled to fall into the background light source, and false detection caused by burrs and jitter of the yarns is avoided; meanwhile, the photoelectric system disclosed by the invention adopts a linear array CCD (Charge Coupled Device) or a photodiode array, so the faults are accurately and quickly detected.

Description

technical field [0001] The patent of the invention relates to the field of yarn quality detection, in particular to a photoelectric system for yarn defect detection. Background technique [0002] In recent years, with the continuous development of the domestic textile market, my country's textile industry occupies a pivotal position in the world today. The accuracy of yarn defect detection has a crucial impact on the production quality of yarn, so how to detect yarn defects more effectively has attracted the attention of people in the textile industry. At present, photoelectric detection technology is infiltrating into the textile industry, and the technology of using photoelectric detection of yarn defects is becoming a trend. [0003] At present, people have put forward many technical solutions in the aspect of yarn defect detection. For example, the dual-light source detection system proposed by Fu Minglei et al. can detect the thickness and flatness of the yarn at the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/89
CPCG01N21/8901G01N21/8903G01N2021/8905
Inventor 冯斌马卫红张文博张易
Owner XIAN TECH UNIV
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