Portable silicon material resistivity measurement device

Abstract

The invention relates to a portable silicon material resistivity measurement device, which is composed of a protection shell, a liquid crystal display screen, a thin-film key, a USB socket, a probe socket, a four-point probe, an internal dry battery box, an integrated circuit board and a anti-slip rubber sleeve, and is characterized in that the protection shell of the portable measurement silicon material resistivity measurement device is in the shape of a box and comprises a wide head portion and a narrow tail portion; the liquid crystal display screen and the thin-film key are set at the same side of the protection shell, the liquid crystal display screen is set at the wide head portion, and the thin-film key is set at the narrow tail portion; the USB socket and the probe socket are arranged in a parallel manner at the end surface of the narrow tail portion; and an inner cavity of the protection shell is provided with a circuit board layer and a battery layer. The beneficial effects lie in that the device can automatically calculate the resistance and the resistivity, analyze the waveform of electric signals to acquire the PN type, data statistics is performed at the same time, and a result is displayed on the liquid crystal display screen; and the four-point probe can reach 0.01% in accuracy, and the accuracy grade is far higher than that of similar products in the market.

Description

technical field [0001] The invention relates to the technical field of measuring the resistivity of silicon materials, in particular to a portable silicon material resistivity measuring device. Background technique [0002] Silicon material includes P-type silicon material, N-type silicon material and heavily doped silicon material with low resistivity. If these finely divided silicon materials are to be reused as raw materials for polysilicon ingot or single crystal drawing, these silicon materials must be strictly controlled conductivity type and resistivity. At present, there have been relevant literature reports on testing equipment and instruments for detecting the resistivity and conductivity type of semiconductor silicon materials, such as the Chinese patent silicon material resistivity detection device with the publication number CN201311457, and the utility model silicon material resistivity detection device Including a voltmeter and an ammeter, the voltmeter is co...

AI Technical Summary

Problems solved by technology

[0003] (1) At present, the equipment for measuring the resistivity of silicon materials on the market generally uses desktop equipment, using 220V AC power supply, the circuit layout is unreasonable, the circuit board is not integrated enough, the volume is too large, it is not easy to carry, the measurement is inconvenient, and the power consumption is low. Larger and has security issues;

[0004] (2) The disclosed patented silicon material resistivity detection device and the silicon material resistivity voice test pen do not have the functions of measuring resistivity and PN type at the same time, nor do they have the functions of liquid crystal display resistivity, PN type, data storage and programming;

[0005] (3) At present, most products have an accuracy of 0.1%~1%, and the accuracy is not high. When the resistivity is between 0.01 and 0.09, the measurement is not accurate, and when the resistivity is below 0.01, it cannot be measured. Therefore, it is necessary to propose a portable , Effective silicon material PN measurement device to solve the above problems

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